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Applied Scanning Probe Methods XI

Scanning Probe Microscopy Techniques

  • Book
  • © 2009

Overview

  • First book summarizing the state of the art of this technique
  • Real industrial applications included
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (8 chapters)

Keywords

Reviews

From the reviews:

"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Authors and Affiliations

  • Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2), Ohio State University, Columbus, USA

    Bharat Bhushan

  • Universität Münster FB 16 Physikalisches Institut, Germany

    Harald Fuchs

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