Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Chapman MJ (ed) (1996) Signal processing in electronic communications. Horwood Publishing, Chichester
Dürig U, Gimzewski JK, Pohl DW (1986) Phys Rev Lett 57:2403–2406
Albrecht TR, Grütter P, Horne D, Rugar D (1991) Frequency modulation detection using high Q cantilevers for enhanced force microscope sensitivity. J Appl Phys 69:668
Kobayashi N et al (2006) High-sensitivity force detection by phase-modulation atomic force microscopy. Jpn J Appl Phys 45:L793–L795
Gunther P, Fischer UCh, Dransfeld K (1989) Appl Phys B: Photophys Laser Chem 48:89
Karrai K, Grober RD (1995) Appl Phys Lett 66:1842
Giessibl FJ (2003) Rev Mod Phys 75:949–983
Kawata S, Shalaev VM (eds) (2007) Tip Enhancement (Advances in nano-optics and nanophotonics). _Elsevier, Amsterdam
Seo Y, Hong S (2005) Quartz crystal resonators based scanning probe microscopy. Mod Phys Lett B19:1303–1322
Giessibl FJ (2003) Advances in atomic force microscopy. Rev Mod Phys 75:949–983
Arnau A (ed) (2004) Piezoelectric transducer and applications. Springer-Verlag, Berlin Heidelberg New York
Franks L (1969) Signals theory. Prentice-Hall, Englewood Cliffs, NJ, USA
Wilmshurst TH, Rizzo JE (1974) An autodyne frequency tracker for laser Doppler anemometry. J Phys E, Sci Instrum 7:924
Kobayashi D, Kawai S, Kawakatsu H (2004) Jpn J Appl Phys 43:4566
Stephens DR (2002) Phase-locked loop for wireless communication, 2 edn. Kluwer, Dordrecht
Dürig U, Züger O, Stadler A (1992) J Appl Phys 72:1778
Loppacher Ch, Bammerlin M, Battiston F, Guggisberg M, Müller D, Hidber HR, Lüthi R, Meyer E, Güntherodt HJ (1998) Appl Phys A 66:S215
Hölscher H (2006) Appl Phys Lett 89:123109
Sader JE, Jarvis SP (2006) Phys Rev B 74:195424
Sader JE, Ushuhashi T, Higgins MJ, Farrell A, Nakayama Y, Jarvis SP (2005) Nanotechnology 16:S94
Arnau A, Sogorb T, Jimenez Y (2000)A continuous motional series resonant frequency monitoring circuit and a new method of determining Butterworth–Van Dyke parameters of a quartz crystal microbalance in fluid media. Rev Sci Instrum 71(6):2563–2571
Giessibl FJ, Hembacher S, Bielefeldt H, Mannhart J (2000) Science 289:422
Giessibl FJ, Hembacher S, Herz M, Schiller Ch, Mannhart J (2004) Nanotechnology 15:S79
Smit RHM, Grande R, Lasanta B, Riquelme JJ, Rubio-Bollinger G, Agraït N (2007) Rev Sci Instrum 78:113705
Seo Y, Choe H, Jhe W (2003) Appl Phys Lett 83:1860
Nishi R, Houda I, Aramata T, Sugawara Y, Morita S (2000) Appl Surface Sci 157:332
Jersch J, Maletzky T, Fuchs H (2006) Interface circuits for quartz crystal sensors in scanning probe microscopy applications. Rev Sci Instrum 77:083701
Jersch J, Fuchs H (2007) Quartz crystal resonator as sensor in scanning probe microscopy. In: IEEE Proceedings of TimeNav’07
ASPRINT (STRP 001601 project under the Sixth Framework Programme of the European Community 2002–2006), see the WWU Muenster contribution
Cherkun AP, Serebryakov DV, Sekatskii SK, Morozov IV, Letokhov VS (2006) Double-resonance probe for near-field scanning optical microscopy. Rev Sci Instrum 77:033703
Cherkun AP, Serebryakov DV, Sekatskii SK, Morozov IV, Letokhov VS (2006) Double-resonance probe for near-field scanning optical microscopy. Rev Sci Instrum 77:033703
Hölscher H, Gotsmann B, Allers W, Schwarz UD, Fuchs H, Wiesendanger R (2001) Phys Rev B 64:075402
Hölscher H, Gotsmann B, Schirmeisen A (2003) Phys Rev B 68:153401
Höppener C, Molenda D, Fuchs H, Naber A (2003) J Microscopy 210(Pt 3):228
Fischer UC (1998) In: Wiesendanger R (ed) Scanning probe microscopy: analytical methods. Springer, Berlin Heidelberg New York
Maletzky T, Jersch J, Fuchs H, and Fischer UCh (2006) Revealing the interaction of metal-nanostructures with dye-molecules by near-field-microscopy. EOS Topical Meeting on Molecular Plasmonic Devices, 27–29 April 2006, Engelberg, Switzerland
Rights and permissions
Copyright information
© 2009 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Jersch, J., Fuchs, H. (2009). Oscillation Control in Dynamic SPM with Quartz Sensors. In: Applied Scanning Probe Methods XI. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85037-3_1
Download citation
DOI: https://doi.org/10.1007/978-3-540-85037-3_1
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-85036-6
Online ISBN: 978-3-540-85037-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)