Abstract
The chapter presents a new approach to multiple testing. In the previous sections, controlled random testing as constructing random test patterns, where the next test pattern is generated while taking into account the previously formed patterns, was presented. In the current section, the concept of multiple controlled random tests based on the controlled random tests approach is introduced. The idea behind multiple controlled random tests is to construct a test session on the basis of short effective controlled random tests rather than on a large number of test patterns.
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Mrozek, I. (2019). Multiple Controlled Random Testing. In: Multi-run Memory Tests for Pattern Sensitive Faults. Springer, Cham. https://doi.org/10.1007/978-3-319-91204-2_7
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DOI: https://doi.org/10.1007/978-3-319-91204-2_7
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