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Introduction to Digital Memory

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Multi-run Memory Tests for Pattern Sensitive Faults

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Abstract

The chapter deals with a classical introduction to semiconductor memory. A short history and taxonomy of semiconductor memory have been provided.

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References

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Authors and Affiliations

  1. Bialystok University of Technology, Bialystok, Poland

    Ireneusz Mrozek

Authors
  1. Ireneusz Mrozek
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Mrozek, I. (2019). Introduction to Digital Memory. In: Multi-run Memory Tests for Pattern Sensitive Faults. Springer, Cham. https://doi.org/10.1007/978-3-319-91204-2_1

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  • DOI: https://doi.org/10.1007/978-3-319-91204-2_1

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-91203-5

  • Online ISBN: 978-3-319-91204-2

  • eBook Packages: EngineeringEngineering (R0)

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