Skip to main content

Counterfeit Integrated Circuits

  • Chapter
  • First Online:
Counterfeit Integrated Circuits

Abstract

Counterfeit integrated circuits (ICs) pose a major concern to the industry and government as they potentially impact the security and reliability of a wide variety of electronic systems. A recent report [1] from the Information Handling Services Inc. [2] shows that reports of counterfeit parts have quadrupled since 2009 (see Fig. 2.1). This data has been compiled from two reporting entities—The Electronic Resellers Association International (ERAI) Inc. [3] and the Government-Industry Data Exchange Program (GIDEP) [4]. This report states that the majority of counterfeit incidents were reported by US-based military bodies and electronic firms from the aerospace industry.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 89.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. J. Cassell, Reports of counterfeit parts quadruple since 2009, challenging US Defence Industry and National Security IHS Pressroom (April 2012), http://press.ihs.com/press-release/design-supply-chain/reports-counterfeit-parts-quadruple-2009-challenging-us-defense-in

    Google Scholar 

  2. Information Handling Services Inc. (IHS), http://www.ihs.com/

  3. ERAI, Report to ERAI, http://www.erai.com/information_sharing_high_risk_parts

  4. GIDEP, Government-Industry Data Exchange Program (GIDEP), http://www.gidep.org/

  5. trust-HUB, http://trust-hub.org/home

  6. U.S. Department of Justice, Administrator of VisionTech Components, LLC sentenced to 38 months in prison for her role in sales of counterfeit integrated circuits destined to U.S. military and other industries. Press Releases (October 2011), http://www.justice.gov/usao/dc/news/2011/oct/11-472.html

  7. U.S. Department of Justice, Massachusetts man pleads guilty to importing and selling counterfeit intergrated circuits from China and Hong Kong (June 2014), http://www.justice.gov/opa/pr/2014/June/14-crm-595.html

  8. B. Carey, Senate inquiry finds widespread counterfeit components. AIN (June 1 2012), http://www.ainonline.com/aviation-news/ain-defense-perspective/2012-06-01/senate-inquiry-finds-widespread-counterfeit-components

  9. J. Reed, Counterfeit parts found on P-8 Posiedons. Defensetech (November 2011), http://defensetech.org/2011/11/08/counterfeit-parts-found-on-new-p-8-posiedons/

  10. R. McCormack, Boeing’s planes are riddled with chinese counterfeit electronic components. Manufacturing and Technology News 19 (June 2012)

    Google Scholar 

  11. T. Kaiser, SAS committee: counterfeit electronics from China could be harmful to military. Dailytech (November 2011)

    Google Scholar 

  12. T. Capaccio, China Counterfeit Parts in U.S. Military Aircraft. Bloomberg (November 2011)

    Google Scholar 

  13. U.S. Senate Committee on Armed Services, Inquiry into counterfeit electronic parts in the Department Of Defence Supply Chain (May 2012)

    Google Scholar 

  14. U.S. Senate Committee on Armed Services, Suspect counterfeit electronic parts can be found on internet purchasing platforms (February 2012), http://www.gao.gov/assets/590/588736.pdf

  15. IHS iSuppli, Top 5 most counterfeited parts represent a $169 billion potential challenge for global semiconductor market (2011)

    Google Scholar 

  16. R. Torrance, D. James, The state-of-the-art in ic reverse engineering, in Proceedings of the 11th International Workshop on Cryptographic Hardware and Embedded Systems. CHES ’09. (Springer, 2009, Berlin), pp. 363–381. http://dx.doi.org/10.1007/978-3-642-04138-9_26

  17. I. McLoughlin, Secure embedded systems: the threat of reverse engineering, in Parallel and Distributed Systems, 2008. ICPADS ’08. 14th IEEE International Conference on (December 2008), pp. 729–736

    Google Scholar 

  18. F. Koushanfar, G. Qu, Hardware metering, in Proc. IEEE-ACM Design Automation Conference (2001), pp. 490–493

    Google Scholar 

  19. G. Contreras, T. Rahman, M. Tehranipoor, Secure split-test for preventing IC piracy by untrusted foundry and assembly, in Proc. International Symposium on Fault and Defect Tolerance in VLSI Systems (2013)

    Google Scholar 

  20. M. Tehranipoor, H. Salmani, X. Zhang, Integrated Circuit Authentication: Hardware Trojans and Counterfeit Detection (Springer, Zurich, 2014)

    Book  Google Scholar 

  21. U. Guin, D. DiMase, M. Tehranipoor, A comprehensive framework for counterfeit defect coverage analysis and detection assessment. J. Electron. Test. 30(1), 25–40 (2014)

    Article  Google Scholar 

  22. U. Guin, D. DiMase, M. Tehranipoor, Counterfeit integrated circuits: Detection, avoidance, and the challenges ahead. J. Electron. Test. 30(1), 9–23 (2014)

    Article  Google Scholar 

  23. U. Guin, K. Huang, D. DiMase, J. Carulli, M. Tehranipoor, Y. Makris, Counterfeit integrated circuits: a rising threat in the global semiconductor supply chain. Proc. IEEE 102(8), 1207–1228 (2014)

    Article  Google Scholar 

  24. U. Guin, D. Forte, M. Tehranipoor, Anti-counterfeit techniques: from design to resign, in Microprocessor Test and Verification (MTV) (2013)

    Google Scholar 

  25. U. Guin, M. Tehranipoor, D. DiMase, M. Megrdichian, Counterfeit IC detection and challenges ahead. ACM/SIGDA E-NEWSLETTER 43(3) (March 2013)

    Google Scholar 

  26. U. Guin, M. Tehranipoor, On Selection of Counterfeit IC Detection Methods, in IEEE North Atlantic Test Workshop (NATW) (May 2013)

    Google Scholar 

  27. B. Hughitt, Counterfeit electronic parts, in NEPP Electronics Technology Workshop (June 2010)

    Google Scholar 

  28. U.S. Environmental Protection Agency, Electronic waste management in the united states through 2009 (May 2011)

    Google Scholar 

  29. BusinessWeek article and video from October 13, 2008, http://images.businessweek.com/ss/08/10/1002_counterfeit_narrated/index.htm

  30. SAE, Counterfeit electronic parts; avoidance, detection, mitigation, and disposition (2009), http://standards.sae.org/as5553/

  31. SAE, Test methods standard; counterfeit electronic parts. Work In Progress, http://standards.sae.org/wip/as6171/

  32. CTI, Certification for coutnerfeit components avoidance program (September 2011)

    Google Scholar 

  33. IDEA, Acceptability of electronic components distributed in the open market, http://www.idofea.org/products/118-idea-std-1010b

  34. Departnent of Defense, Performance specification: hybrid microcircuits, general specification for (2009), http://www.dscc.dla.mil/Downloads/MilSpec/Docs/MIL-PRF-38534/prf38534.pdf

  35. J. Rhea, BAE Systems moves into third generation rad-hard processors (May 2002)

    Google Scholar 

  36. The Committee’s Investigation into Counterfeit Electronic Parts in the Department of Defense Supply Chain. Senate Hearing 112–340 (November 2011), http://www.gpo.gov/fdsys/pkg/CHRG-112shrg72702/html/CHRG-112shrg72702.htm

  37. CTI, Counterfeit Examples: Electronic Components (2013), http://www.cti-us.com/pdf/CCAP-101InspectExamplesA6.pdf

  38. C. Mouli, W. Carriker, Future Fab: How software is helping Intel go nano–and beyond. IEEE Spectr. 44(3), 38–43 (2007)

    Article  Google Scholar 

  39. L.-T. Wang, C.-W. Wu, X. Wen, VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) (Morgan Kaufmann, San Francisco, 2006).

    Google Scholar 

  40. R.J. Abella, J.M. Daschbach, R.J. McNichols, Reverse engineering industrial applications. Comput. Ind. Eng. 26(2), 381–385 (1994), http://dx.doi.org/10.1016/0360-8352(94)90071-X

  41. M. Tehranipoor, F. Koushanfar, A survey of hardware trojan taxonomy and detection. IEEE Des. Test Comput. 27(1), 10–25 (2010)

    Article  Google Scholar 

  42. S. Adee, The hunt for the kill switch (May 2008), http://spectrum.ieee.org/semiconductors/design/the-hunt-for-the-kill-switch

  43. CHASE, CHASE workshop on secure/trustworthy systems and supply chain assurance (April 2014), https://www.chase.uconn.edu/chase-workshop-2014.php

  44. Defense Science Board (DSB), Study on high performance microchip supply (2005), http://www.acq.osd.mil/dsb/reports/ADA435563.pdf

  45. Semiconductor Industry Association (SIA), Winning the battle against counterfeit semiconductor products (August 2013)

    Google Scholar 

  46. U.S. Department Of Commerce, Defense industrial base assessment: counterfeit electronics (January 2010)

    Google Scholar 

  47. H. Levin, Electronic waste (e-waste) recycling and disposal—facts, statistics & solutions (2011), http://www.moneycrashers.com/electronic-e-waste-recycling-disposal-facts/

  48. L.W. Kessler, T. Sharpe, Faked parts detection. Print. Circuit Des. Fabr. 27(6), 64 (2010)

    Google Scholar 

  49. J. Villasenor, M. Tehranipoor, Chop shop electronics. Spectr. IEEE 50(10), 41–45 (2013)

    Article  Google Scholar 

  50. SAE, SAE International, http://www.sae.org/

  51. SAE, Fraudulent/counterfeit electronic parts; tool for risk assessment of distributors (2011), http://standards.sae.org/arp6178/

  52. SAE, Fraudulent/counterfeit electronic parts: avoidance, detection, mitigation, and disposition - distributors counterfeit electronic parts; avoidance protocol, distributors (2012), http://standards.sae.org/as6081/

  53. SAE, Fraudulent/counterfeit electronic parts: avoidance, detection, mitigation, and disposition—authorized/franchised distribution. Work In Progress, http://standards.sae.org/wip/as6496/

  54. CTI, Components Technology Institute, Inc. http://www.cti-us.com/

  55. B. Gassend, D. Clarke, M. van Dijk, S. Devadas, Silicon physical random functions, in Proc. of the 9th ACM conference on Computer and Communications Security. CCS ’02 (ACM, New York, 2002), pp. 148–160

    Google Scholar 

  56. N. Robson, J. Safran, C. Kothandaraman, A. Cestero, X. Chen, R. Rajeevakumar, A. Leslie, D. Moy, T. Kirihata, S. Iyer, Electrically programmable fuse (efuse): from memory redundancy to autonomic chips, in CICC (2007), pp. 799–804

    Google Scholar 

  57. M. Miller, J. Meraglia, J. Hayward, Traceability in the age of globalization: a proposal for a marking protocol to assure authenticity of electronic parts, in SAE Aerospace Electronics and Avionics Systems Conference (October 2012)

    Book  Google Scholar 

  58. C. Kuemin, L. Nowack, L. Bozano, N.D. Spencer, H. Wolf, Oriented assembly of gold nanorods on the single-particle level. Adv. Funct. Mater. 22(4), 702–708 (2012)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer International Publishing Switzerland

About this chapter

Cite this chapter

Tehranipoor, M.(., Guin, U., Forte, D. (2015). Counterfeit Integrated Circuits. In: Counterfeit Integrated Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-11824-6_2

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-11824-6_2

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-11823-9

  • Online ISBN: 978-3-319-11824-6

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics