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An I/O Line Configuration and Organization of DRAM

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High-Bandwidth Memory Interface

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Abstract

For state-of-the-art DRAM, the core operating speed is around 200 Mb/s. However, data is transferred by 7 Gb/s/pin for GDDR5 (R. Rho et al., IEEE J. Solid-State Circuits, vol. 45, no. 1, pp. 120–133, 2010; T.-Y. Oh et al., IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 120–133, 2011; D. Shin et al., IEEE Symp. on Very Large Scale Integr. Circuits Dig. Tech. Papers, pp. 138–139, 2009). This is possible because pre-fetch scheme is employed. In this session, we explain the pre-fetch scheme and global IO configuration for understanding speed limits restricted by DRAM core operation.

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References

  1. R. Rho et al., “A 75 nm 7 Gb/s/pin 1 Gb GDDR5 graphics memory device with bandwidth improvement techniques,” IEEE J. Solid-State Circuits, vol. 45, no. 1, pp. 120–133, Jan. 2010.

    Google Scholar 

  2. T.-Y. Oh et al., “A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM with 2.5 ns bank to bank active time and no bank group restriction,” IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 120–133, Jan. 2011.

    Google Scholar 

  3. D. Shin et al., “Wide-range fast-lock duty-cycle corrector with offset-tolerant duty-cycle detection scheme for 54 nm 7 Gb/s GDDR5 DRAM interface” IEEE Symp. on Very Large Scale Integr. Circuits Dig. Tech. Papers, 2009, pp. 138–139.

    Google Scholar 

  4. JEDEC, JESD79F.

    Google Scholar 

  5. JEDEC, JESD79-2F.

    Google Scholar 

  6. JEDEC, JESD79-3F.

    Google Scholar 

  7. JEDEC, JESD79-4.

    Google Scholar 

  8. T.-Y. Oh et al., “A 7 Gb/s/pin GDDR5 SDRAM with 2.5 ns bank-to-bank active time and no bank-group restriction”, in ISSCC Dig. Tech. Papers, pp. 434–435, Feb. 2010.

    Google Scholar 

  9. K. Koo et al., “A 1.2 V 38 nm 2.4 Gb/s/pin 2 Gb DDR4 SDRAM with bank group and × 4 half-page architecture”, in ISSCC Dig. Tech. Papers, pp. 40–41, Feb. 2012.

    Google Scholar 

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Correspondence to Chulwoo Kim .

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Kim, C., Song, J., Lee, HW. (2014). An I/O Line Configuration and Organization of DRAM. In: High-Bandwidth Memory Interface. SpringerBriefs in Electrical and Computer Engineering. Springer, Cham. https://doi.org/10.1007/978-3-319-02381-6_2

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  • DOI: https://doi.org/10.1007/978-3-319-02381-6_2

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-02380-9

  • Online ISBN: 978-3-319-02381-6

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