Abstract
The reliability of microelectronic packages and assemblies is established through reliability testing of the device. In a reliability test, assemblies with BGA solder joints are subjected to temperature cycles, as prescribed by reliability test standards (e.g. JEDEC 2000).
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Tamin, M.N., Shaffiar, N.M. (2014). Application II: Solder Joints Under Temperature and Mechanical Load Cycles. In: Solder Joint Reliability Assessment. Advanced Structured Materials, vol 37. Springer, Cham. https://doi.org/10.1007/978-3-319-00092-3_6
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DOI: https://doi.org/10.1007/978-3-319-00092-3_6
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