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Field-Ion Microscope Studies of Planar Faults

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Field-Ion Microscopy

Abstract

A perfect dislocation, i.e., its Burgers vector is a unit translation in the lattice, can dissociate into two or more partial dislocations separated by widths of stacking faults. The prerequisite for such a dissociation is that a mechanically stable new configuration should be available. The dissociation reaction leads to a lowering of the elastic energy of the perfect dislocation. This is balanced, however, by the increase in misfit energy in the plane. Several books on dislocations give an excellent treatment of these ideas.1

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Author information

Authors and Affiliations

  1. Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley, Calif., USA

    S. Ranganathan (Postdoctoral Research Associate)

Authors
  1. S. Ranganathan
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Editor information

Editors and Affiliations

  1. Department of Metallurgical and Materials Engineering, University of Florida, Gainesville, Florida, USA

    John J. Hren

  2. Inorganic Materials Research Division, Lawrence Radiation Laboratory, University of California, Berkeley, California, USA

    S. Ranganathan

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© 1968 Springer Science+Business Media New York

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Ranganathan, S. (1968). Field-Ion Microscope Studies of Planar Faults. In: Hren, J.J., Ranganathan, S. (eds) Field-Ion Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-6513-4_8

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  • DOI: https://doi.org/10.1007/978-1-4899-6513-4_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-6241-6

  • Online ISBN: 978-1-4899-6513-4

  • eBook Packages: Springer Book Archive

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