Field-Ion Microscopy

  • John J. Hren
  • S. Ranganathan

About this book

Keywords

evaluation materials science microscopy testing

Editors and affiliations

  • John J. Hren
    • 1
  • S. Ranganathan
    • 2
  1. 1.Department of Metallurgical and Materials EngineeringUniversity of FloridaGainesvilleUSA
  2. 2.Inorganic Materials Research Division, Lawrence Radiation LaboratoryUniversity of CaliforniaBerkeleyUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4899-6513-4
  • Copyright Information Springer Science+Business Media New York 1968
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4899-6241-6
  • Online ISBN 978-1-4899-6513-4
  • About this book
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