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Some Geometrical Aspects of Surfaces Related to Field-Ion Microscopy

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Field-Ion Microscopy

Abstract

Most surfaces which we encounter in practice have an extremely complicated surface structure with surface irregularities, deformed layers, oxide layers, and adsorbed gases.1,2 Fortunately on the surface of field-emission tips all the complicating outer layers have been removed, and we can therefore interpret our patterns for a clean surface on an undeformed crystal. We shall therefore treat the crystal as an assembly of hard spheres, and we shall see what sort of arrangements of spheres we should expect at the surface.

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Moore, A.J.W. (1968). Some Geometrical Aspects of Surfaces Related to Field-Ion Microscopy. In: Hren, J.J., Ranganathan, S. (eds) Field-Ion Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-6513-4_5

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  • DOI: https://doi.org/10.1007/978-1-4899-6513-4_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4899-6241-6

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