Abstract
During testing faulty ICs are identified. These, along with ICs that fail in the field, are collected. To investigate causes of these failures, faulty ICs are examined off-line. This is referred to as fault diagnosis or failure analysis. Fault diagnosis provides information that is used to improve manufacturing yield.
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© 1997 Springer Science+Business Media New York
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Chakravarty, S., Thadikaran, P.J. (1997). Fault Diagnosis. In: Introduction to IDDQ Testing. Frontiers in Electronic Testing, vol 8. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6137-8_9
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DOI: https://doi.org/10.1007/978-1-4615-6137-8_9
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-7812-9
Online ISBN: 978-1-4615-6137-8
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