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Introduction to IDDQ Testing

  • Sreejit Chakravarty
  • Paul J. Thadikaran

Part of the Frontiers in Electronic Testing book series (FRET, volume 8)

Table of contents

  1. Front Matter
    Pages i-xix
  2. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 1-8
  3. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 9-26
  4. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 27-58
  5. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 59-98
  6. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 99-144
  7. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 145-173
  8. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 175-199
  9. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 201-226
  10. Sreejit Chakravarty, Paul J. Thadikaran
    Pages 227-261
  11. Kenneth M. Wallquist
    Pages 263-286
  12. Back Matter
    Pages 287-323

About this book

Introduction

Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective.
A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson.
This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

Keywords

LSI VLSI circuit design computer-aided design (CAD) diagnosis integrated circuit logic microsystems

Authors and affiliations

  • Sreejit Chakravarty
    • 1
  • Paul J. Thadikaran
    • 2
  1. 1.State University of New York at BuffaloUSA
  2. 2.Intel CorporationUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4615-6137-8
  • Copyright Information Kluwer Academic Publishers 1997
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4613-7812-9
  • Online ISBN 978-1-4615-6137-8
  • Series Print ISSN 0929-1296
  • Buy this book on publisher's site
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