Abstract
The dominant failure modes in VLSI circuits are opens and shorts [187, 188]. Gate-oxide shorts are a special type of shorts and are discussed separately. In addition to these, other less frequent defects are [298]: punch throughs, parasitic transistor leaks, defective pn-junctions, incorrect threshold voltages, etc. These defects also lead to abnormally high I DDQ [298].
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© 1997 Springer Science+Business Media New York
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Chakravarty, S., Thadikaran, P.J. (1997). Physical Defects. In: Introduction to IDDQ Testing. Frontiers in Electronic Testing, vol 8. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6137-8_4
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DOI: https://doi.org/10.1007/978-1-4615-6137-8_4
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