Abstract
This chapter introduces the problems of variation with respect to custom integrated circuit design. It then describes several design flows, and how well they handle or fail to handle variation. The chapter concludes with an outline for the rest of the book, which covers methodologies and tools for handling variation in industrial design settings.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
CADÂ =Â computer-aided design, ITÂ =Â information technology.
- 2.
RFÂ =Â radio frequency, I/OÂ =Â input/output, SPICEÂ =Â Simulation Program with Integrated Circuit Emphasis (Nagel and Pederson 1973), and RTLÂ =Â Resistor-Transistor Logic.
- 3.
NMOSÂ =Â N-channel MOSFET, PMOSÂ =Â P-channel MOSFET, MOSFETÂ =Â metal-oxide-semiconductor field-effect transistor.
References
Chiang C, Kawa J (2007) Design for manufacturability and yield for nano-scale CMOS. Springer, Dordrecht
Drennan PG, McAndrew CC (2003) Understanding MOSFET mismatch for analog design. IEEE J Solid State Circuits 38(3):450–456
ITRS (2011) International Technology Roadmap for Semiconductors, http://itrs.net
Kundu S, Sreedhar A (2010) Nanoscale CMOS VLSI circuits: design for manufacturability. McGraw-Hill, NY
Maricau E, Gielen GGE (2010) Efficient variability-aware NBTI and hot carrier circuit reliability analysis. IEEE Trans CAD Integr Circuits Syst 29(12):1884–1893
Nagel LW, Pederson DO (1973) SPICE (Simulation Program with Integrated Circuit Emphasis). Memorandum No. ERL-M382. University of California, Berkeley, Apr 1973
Orshansky M, Nassif S, Boning D (2010) Design for manufacturability and statistical design: a constructive approach. Springer, NY
Pelgrom MJ, Duinmaijer ACJ (1989) Matching properties of MOS transistors. IEEE J Solid State Circuits 24:1433–1440
Srivastava A, Sylvester D, Blaauw D (2010) Statistical analysis and optimization for VLSI: timing and power. Springer, NY
Yao P et al (2012) Understanding and designing for variation in GLOBALFOUNDRIES 28Â nm technology. In: Proceedings of design automation conference (DAC), San Francisco
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2013 Springer Science+Business Media New York
About this chapter
Cite this chapter
McConaghy, T., Breen, K., Dyck, J., Gupta, A. (2013). Introduction. In: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-2269-3_1
Download citation
DOI: https://doi.org/10.1007/978-1-4614-2269-3_1
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-2268-6
Online ISBN: 978-1-4614-2269-3
eBook Packages: EngineeringEngineering (R0)