Advertisement

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

A Hands-on Field Guide

  • Trent McConaghy
  • Kristopher Breen
  • Jeffrey Dyck
  • Amit Gupta

Table of contents

  1. Front Matter
    Pages i-xv
  2. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 1-12
  3. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 13-39
  4. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 41-63
  5. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 65-114
  6. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 115-167
  7. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 169-186
  8. Trent McConaghy, Kristopher Breen, Jeffrey Dyck, Amit Gupta
    Pages 187-188

About this book

Introduction

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.  

  • Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.
  • Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.
  • Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.
  • Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.
  • Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.
  • Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.

Keywords

Custom Integrated Circuits Integrated Circuits Resilient VLSI Circuits Statistical process variations Variation-Aware CAD Variation-Aware Integrated Circuit Design Variation-Tolerant Integrated Circuit Design

Authors and affiliations

  • Trent McConaghy
    • 1
  • Kristopher Breen
    • 2
  • Jeffrey Dyck
    • 3
  • Amit Gupta
    • 4
  1. 1.Solido Design Automation, Inc.SaskatoonCanada
  2. 2.Solido Design AutomationSaskatoonCanada
  3. 3.Solido Design Automation Inc.SaskatoonCanada
  4. 4.Solido Design Automation Inc.SaskatoonCanada

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-2269-3
  • Copyright Information Springer Science+Business Media New York 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-2268-6
  • Online ISBN 978-1-4614-2269-3
  • Buy this book on publisher's site
Industry Sectors
Pharma
Automotive
Biotechnology
Electronics
IT & Software
Telecommunications
Energy, Utilities & Environment
Aerospace
Engineering