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Abstract

In this chapter we cover the first proposed test approaches that reuse the NoC as Test Access Mechanism (TAM) in a core-based system. First, the basic reuse strategy is presented, including the very few modifications implemented in the network interface, and the definition of the test packets to make the test possible. Then, two test scheduling approaches (preemptive and non-preemptive) are discussed. These basic reuse strategies focus on the definition of specific test scheduling algorithms, since the TAM (NoC) architecture and transport capacity are given. The reuse model and the scheduling algorithms presented here assume a stream-like communication can be established, through the NoC, between the cores under test and the external test sources and sinks. This assumption implies a NoC with guaranteed fixed bandwidth and latency. Other reuse models (use of different test packet models and BE NoCs) are discussed in Chap. 5.

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References

  • Cota E, Liu C (2006) Constraint-driven test scheduling for NoC-based systems. IEEE Trans CAD 25(11):2465–2478

    Google Scholar 

  • Cota E, Carro L, Wagner F, Lubaszewski M (2003a) Power-aware NoC reuse on the testing of core-based systems. In: Proceedings of the international test conference (ITC), Charlotte, pp 612–621

    Google Scholar 

  • Cota E, Kreutz M, Zeferino CA, Carro L, Lubaszewski M, Susin A (2003b) The impact of NoC reuse on the testing of core-based systems. In: Proceedings of the 21st VLSI test symposium (VTS), Napa Valley, pp 128–133

    Google Scholar 

  • Cota E, Carro L, Lubaszewski M (2004) Reusing an on-chip network for the test of core-based systems. ACM Trans Des Automat Electron Syst 9(4):471–499

    Article  Google Scholar 

  • De Micheli G, Benini L (2006) Networks on chips: technology and tools. Morgan Kaufmann, San Francisco (Series in Systems on Silicon)

    Google Scholar 

  • Gerez SH (1998) Algorithms for VLSI design automation. Wiley, Baffins Lane

    Google Scholar 

  • Iyengar V, Chakrabarty K (2002) System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints. IEEE Trans CAD 21(9):1088–1094

    Google Scholar 

  • Iyengar V, Chakrabarty K, Marinissen EJ (2002) Test wrapper and test access mechanism co-optimization for system-on-chip. J Electron Test 18(4):213–230

    Article  Google Scholar 

  • Liu C, Cota E, Sharif H, Pradhan DK (2004) Test scheduling for network-on-chip with BIST and precedence constraints. In: Proceedings of the international test conference (ITC), Charlotte, pp 1369–1378

    Google Scholar 

  • Marinissen EJ, Iyengar V, Chakrabarty K (2002) ITC’02 SoC test benchmarks. http://itc02socbenchm.pratt.duke.edu/. Accessed 23 Aug 2010

  • Vermeulen B, Dielissen J, Goossens K, Ciordas C (2003) Bringing communication networks on a chip: test and verification implications. IEEE Commun Mag 41(9):74–81

    Article  Google Scholar 

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Correspondence to Érika Cota .

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Cota, É., de Morais Amory, A., Lubaszewski, M.S. (2012). NoC Reuse for SoC Modular Testing. In: Reliability, Availability and Serviceability of Networks-on-Chip. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-0791-1_4

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  • DOI: https://doi.org/10.1007/978-1-4614-0791-1_4

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  • Publisher Name: Springer, Boston, MA

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  • Online ISBN: 978-1-4614-0791-1

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