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Part of the book series: Frontiers in Electronic Testing ((FRET,volume 27))

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© 2006 Springer

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Josephson, D., Gottlieb, B. (2006). Silicon Debug. In: Gizopoulos, D. (eds) Gizopoulos / Advances in ElectronicTesting. Frontiers in Electronic Testing, vol 27. Springer, Boston, MA. https://doi.org/10.1007/0-387-29409-0_3

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  • DOI: https://doi.org/10.1007/0-387-29409-0_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-29408-7

  • Online ISBN: 978-0-387-29409-4

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