Gizopoulos / Advances in ElectronicTesting

  • Dimitris Gizopoulos

Part of the Frontiers in Electronic Testing book series (FRET, volume 27)

Table of contents

  1. Front Matter
    Pages 1-22
  2. Robert C Aitken
    Pages 1-42
  3. Jaume Segura, Charles Hawkins, Jerry Soden
    Pages 43-75
  4. Doug Josephson, Bob Gottlieb
    Pages 77-108
  5. Adam Cron
    Pages 109-139
  6. Wolfgang Maichen
    Pages 141-178
  7. Al Coruch, Geir Eide
    Pages 179-216
  8. Rubin Parekhji
    Pages 217-261
  9. R Dean Adams
    Pages 263-300
  10. Stephen Sunter
    Pages 301-336
  11. Randy Wolf, Mustapha Slamani, John Ferrario, Jayendra Bhagat
    Pages 337-369
  12. Kenneth P Parker
    Pages 371-406
  13. Back Matter
    Pages 407-412

About this book

Introduction

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today’s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.

The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.

Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.

"There is a definite need for documenting the advances in testing … I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. […] the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. […] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.

Keywords

Advances in Testing CMOS Electronic Circuits Testing Hardware Integrated Circuits Microelectronics Manufacturing Testing Methodologies drift transistor integrated circuit system on chip (SoC)

Editors and affiliations

  • Dimitris Gizopoulos
    • 1
  1. 1.University of PiraeusGreece

Bibliographic information

  • DOI https://doi.org/10.1007/0-387-29409-0
  • Copyright Information Springer-Verlag US 2006
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-0-387-29408-7
  • Online ISBN 978-0-387-29409-4
  • Series Print ISSN 0929-1296
  • About this book
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