Abstract
This chapter presents a collection of case studies dealing with electromagnetic compatibility of integrated circuits. Emission and susceptibility of microcontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.
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Ben Dhia, S., Ramdani, M., Sicard, E. (2006). Case Studies. In: Ben Dhia, S., Ramdani, M., Sicard, E. (eds) Electromagnetic Compatibility of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/0-387-26601-1_6
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DOI: https://doi.org/10.1007/0-387-26601-1_6
Publisher Name: Springer, Boston, MA
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