This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
A. Birolini, Quality and Reliability of Technical Systems, Springer-Verlag, Berlin, 1994.
M.J. Ohletz, “Hybrid built-in self-test (HBIST) for mixed analogue/digital integrated circuits”, Proceedings, 2nd European Test Conference, pp. 307–316, April 1991.
W. Hochwald and J.D. Bastian, “A dc approach for analog fault dictionary determination”, IEEE Transactions on Circuits and systems, Vol. CAS-26, pp. 523–529, July 1979.
M.V. Mahony, DSP-Based Testing of Analog and Mixed-Signal Circuits, IEEE Computer Society Press, 1987.
M. F. Toner and G. W. Roberts, “A BIST Scheme for an SNR, gain tracking, and frequency response test of a sigma-delta ADC”, IEEE Trans. on Circuits and Systems-II: Analog and Digital Signal Processing, pp. 1–15, Jan. 1995.
C-Y. Pan and K-T. Cheng, “Pseudo-random testing and signature analysis for mixed-signal circuits”, Digest of Papers, IEEE/ACM International Conference on Computer-Aided Design (ICCAD-95), pp. 102–107, November 1995.
C-Y. Pan, K-T. Cheng and S. Gupta, “Fault macro-modeling and a test strategy for Opamps”, Journal of Electronic Testing: Theory and Application, Vol. 9, pp. 225–235, December 1996.
R.M. Gray and J.W. Goodman, Fourier Transforms; An Introduction for Engineers, Kluwer Academic Publishers, Norwell, Massachusetts, 1995.
M.V. Mahony, “New techniques for high speed analog testing”, Proceedings, International Test Conference, pp. 589–597, October 1983.
R. Patton, P. Frank and R. Clark, eds., Fault Diagnosis in Dynamic Systems: Theory and Applications, Prentice Hall International (UK) Ltd., Hertfordshire, 1989.
R. Isermann, “Process fault detection based on modeling and estimation methods-a survey”, Automatica, Vol. 20, pp. 387–404, July 1984.
P.M. Frank, “Fault diagnosis in dynamic systems using analytical and knowledgebased redundancy-a survey and some new results”, Automatica, Vol. 26, pp. 459–474, May 1990.
P. Kabisatpathy, A. Barua and S. Sinha, “Fault detection and diagnosis in analog integrated circuits using artificial neural networks in a pseudorandom testing scheme”, Proceedings, 3rd Intrnational Conference on Electrical & Computer Engineering (ICECE 2004), pp. 52–55, December 2004.
B. Kaminska, K. Arabi, I. Bell, J. L. Heurtas, B. Kim, A. Rueda and M. Soma, “Analog and mixed-signal benchmark circuits — first release”, Proceedings, 1997 IEEE International Test Conference (ITC’97), pp. 183–190, November 1997.
B.A. Wooley, S J. Wong and D O. Pederson, “A computer-aided evaluation of the 741 amplifier”, IEEE Journal of Solid-State Circuits, Vol. SC-6, No. 6, pp. 357–366, December 1971.
P.W. Tuinenga, SPICE: A Guide to Circuit Simulation and Analysis using PSpice, Prentice-Hall, New Jersey, 1992.
H. Demuth and M. Beale, Neural Network Toolbox User’s Guide, The MathWorks, Inc., Natick, 1994
IEEE mixed-signal benchmark circuit home page available on the web-page at: http://faculty.washington.edu/manisoma/madtest/benchmarks/OpAmp.htm.
R. Spina and S.J. Upadhyaya, “Linear circuit fault diagnosis using neuromorphic analyzers”, IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, Vol. 44, pp. 188–196, March 1997.
Rights and permissions
Copyright information
© 2005 Springer
About this chapter
Cite this chapter
(2005). Fault Diagnosis Methodology. In: Fault Diagnosis of Analog Integrated Circuits. Frontiers in Electronic Testing, vol 30. Springer, Boston, MA. https://doi.org/10.1007/0-387-25743-8_4
Download citation
DOI: https://doi.org/10.1007/0-387-25743-8_4
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-25742-6
Online ISBN: 978-0-387-25743-3
eBook Packages: EngineeringEngineering (R0)