Advertisement

Fault Diagnosis of Analog Integrated Circuits

  • Prithviraj Kabisatpathy
  • Alok Barua
  • Satyabroto Sinha

Part of the Frontiers in Electronic Testing book series (FRET, volume 30)

Table of contents

  1. Front Matter
    Pages i-2
  2. Pages 3-22
  3. Back Matter
    Pages 153-182

About this book

Introduction

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort.

Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential.

The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Keywords

Analog Integrated Circuit Artificial Neural Network Design for Test and Built-in-self-Test FRET Fault Diagnosis Frontiers Electronic Test Leistungsfeldeffekttransistor bipolar junction transistor bipolar power transistor field-effect transistor integrated circuit metal oxide semiconductur field-effect transistor

Authors and affiliations

  • Prithviraj Kabisatpathy
    • 1
  • Alok Barua
    • 2
  • Satyabroto Sinha
    • 2
  1. 1.Biju Patnaik University of TechnologyBhubaneswarIndia
  2. 2.Indian Institute of TechnologyKharagpurIndia

Bibliographic information

  • DOI https://doi.org/10.1007/b135977
  • Copyright Information Springer 2005
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-0-387-25742-6
  • Online ISBN 978-0-387-25743-3
  • Series Print ISSN 0929-1296
  • Buy this book on publisher's site
Industry Sectors
Pharma
Automotive
Biotechnology
Electronics
IT & Software
Telecommunications
Energy, Utilities & Environment
Aerospace
Engineering