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© 2005 Springer
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(2005). Technological Aspects. In: Matching Properties of Deep Sub-Micron MOS Transistors. The Kluwer International Series in Engineering and Computer Science, vol 851. Springer, Boston, MA. https://doi.org/10.1007/0-387-24313-5_5
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DOI: https://doi.org/10.1007/0-387-24313-5_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-24314-6
Online ISBN: 978-0-387-24313-9
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