Abstract
This chapter addresses the impact of digital substrate noise on analog circuits embedded in mixed-signal integrated systems. A high-level modeling methodology is presented that allows to simulate in acceptable CPU times the impact of a complex noise signal resulting from a large digital part on the performance of an embedded analog part in a large mixed-signal system. Measurements were performed on an embedded comparator, and show the important impact of the digital noise on this design. The measurement results were used to predict the impact on an embedded analog-to-digital converter.
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References
M. Van Heijningen, M. Badaroglu, S. Donnay, M. Engels, and I. Bolsens, “High-Level Simulation of Substrate Noise Generation Including Power Supply Noise Coupling”, Proc. Design Automation Conference 2000 (DAC’02), pp. 446–451, 2000.
M. Van Heijningen, M. Badaroglu, S. Donnay, H. De Man, G. Gielen, M. Engels, I. Bolsens, “Substrate Noise Generation in Complex Digital Systems, Efficient Modeling and Simulation Methodology and Experimental Verification”, J. of Solid State Circuits (JSSC), pp. 1065–1072, August 2002.
F. J. Clement, E. Zysman, M. Kayal, Prof. M. Declercq, “LAYIN: Toward a Global Solutionfor Parasitic Coupling Modeling and Visualization”, Proc. IEEE Custom Integrated Circuits Conference (C1CC’94), pp. 24.4.1–24.4.4, 1994.
A. J. Van Genderen, N. P. Der Meijs, “SPACE: A Finite Element Based Capacitance Extraction Program for Submicron Integrated Circuits”, in Software Tools for Process, Device and Circuits Modeling, pp. 45–55, Bode Press, Dublin Ireland, July, 1989.
K. Bult, and A. Buchwald, “Embedded 240-mW 10-b 50MS/s CMOS ADC in 1mm2”, IEEE Jour. Of Solid—State Circuits, Vol. 32, No. 12, pp. 1887–1895, Dec. 1997.
J. Vandenbussche, K. Uyttenhove, E. Lauwers, M. Steyaert, G. Gielen “A8-bit 200MS/s Interpolating/Averaging CMOS A/D Converter”, Proc. IEEE Custom Integrated Circuits Conference (CICC’02), pp. 23.3.1–23.3.4, May 2002.
B. Razavi, Principle of Data Conversion System Design, ed. I.E.E.E. Press, 1995.
B. Razavi, and B. A. Wooley, “Design Techniquesfor High-Speed,High-Resolution Comparators”, IEEE Jour. Of Solid-State Circuits, vol. 27 No 12, pp. 1916–1926, Dec. 1992.
Online: BANDIT Project home page: http://www.imec.be/bandit
M. Badaroglu, M. Van Heijningen, V. Gravot, J. Compiet, S. Donnay, M. Engels, G. Gielen, and H. De Man, “Methodology and Experimental Verification for Substrate Noise Reductionin CMOS Mixed-Signal ICs with Synchronous Digital Circuits”, Digestof Technical paper IEEE International Solid State Circuit Conference ISSCC 2002, Session 16, San Francisco-USA, Feb. 3–7 2002.
M. Van Heijningen, J. Compiet, P. Wambacq, S. Donnay, M.G.E. Engels, and I. Bolsens, “Analysis and Experimental Verification of Digital Substrate Noise Generation for Epi-Type Substrate”, J. of Solid State Circuits, July 2000.
D. A. Johns, K. Martin, Analog Integrated Circuit Design, ed. I.E.E.E. Press, 1995.
R. Van De Plassche, Integrated Analog-to-Digital and Digital-to-Analog Converters, ed. Kluwer Academic Publishers, 1992.
S. Saad Awad, “Analysisof Accumulated Timing-Jitter inthe Time Domain”, IEEE Trans. On Instrumentation and Measurements, Vol. 47, No. 1, pp 69–73, Feb. 1998.
T. Wakimoto, Y. Akazawa, and S. Konaka, “Si Bipolar 2-GHz 6-bit Flash A/D Conversion LSI”, IEEE Jour. Of Solid-State Circuits, vol. 23 No 6, pp. 1345–11350, Dec. 1988.
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Zinzius, Y., Gielen, G., Sansen, W. (2004). Modeling the Impact of Digital Substrate Noise on Analog Integrated Circuits. In: Donnay, S., Gielen, G. (eds) Substrate Noise Coupling in Mixed-Signal ASICs. Springer, Boston, MA. https://doi.org/10.1007/0-306-48170-7_7
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DOI: https://doi.org/10.1007/0-306-48170-7_7
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-7381-6
Online ISBN: 978-0-306-48170-3
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