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Part of the book series: Frontiers in Electronic Testing ((FRET,volume 22A))

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Summary

A content addressable memory is a very useful and yet very complex array. The topology includes an embedded compare function that is spread across the bit cells in the compare array of the CAM. This feature is used to select the remainder of the data to be read or written through the addressing based on matching to this compare. Various masking schemes are possible including a ternary content addressable memory, which allows individual bit cells to either participate in a match as a “1” / “0” or be masked and not participate. CAMs, through their usefulness, will continue to grow in size and will proliferate through other semiconductor chips in the future.

“To what shall I compare thee?”

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© 2003 Kluwer Academic Publishers

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(2003). Content Addressable Memories. In: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Frontiers in Electronic Testing, vol 22A. Springer, Boston, MA. https://doi.org/10.1007/0-306-47972-9_5

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  • DOI: https://doi.org/10.1007/0-306-47972-9_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4020-7255-0

  • Online ISBN: 978-0-306-47972-4

  • eBook Packages: Springer Book Archive

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