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The Instrument

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Transmission Electron Microscopy

Abstract

We’ve introduced all the essential components of the TEM. Now it’s time to see how the guns, lenses, and detectors are combined to form the microscope. Just as we do for the visible-light microscope (VLM), it’s convenient to divide the TEM up into three components: the illumination system, the objective lens/stage, and the imaging system. The illumination system comprises the gun and the condenser lenses and its role is to take the electrons from the source and transfer them to your specimen. You can operate the illumination system in two principal modes: parallel beam and convergent beam. The first mode is used for TEM imaging and diffraction, while the second is used for scanning (STEM) imaging, microanalysis, and microdiffraction.

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References

General References

  • Chapman, S.K. (1980) Understanding and Optimizing Electron Microscope Performance 1. Transmission Microscopy, Science Reviews Ltd., London.

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  • Chapman, S.K. (1986) Maintaining and Monitoring the TEM, Royal Microscopical Society Handbook, No. 8, Oxford University Press, New York.

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  • Chescoe, D. and Goodhew, P.J. (1990) The Operation of Transmission and Scanning Microscopes, Royal Microscopical Society Handbook, No. 20, Oxford University Press, New York.

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Specific References

  • Edington, J.W. (1976) Practical Electron Microscopy in Materials Science, Van Nostrand Reinhold, New York.

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  • Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Romig, A.D. Jr. Lyman, C.E., Fiori, C.E., and Lifshin, E. (1992) Scanning Electron Microscopy and X-ray Microanalysis, Plenum Press, New York.

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  • LePoole, J.B. (1947) Philips Tech. Rundsch. 9, 93.

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Author information

Authors and Affiliations

  1. Lehigh University, Bethlehem, Pennsylvania, USA

    David B. Williams

  2. University of Minnesota, Minneapolis, Minnesota, USA

    C. Barry Carter

Authors
  1. David B. Williams
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  2. C. Barry Carter
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© 1996 Springer Science+Business Media New York

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Williams, D.B., Carter, C.B. (1996). The Instrument. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_9

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  • DOI: https://doi.org/10.1007/978-1-4757-2519-3_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-45324-3

  • Online ISBN: 978-1-4757-2519-3

  • eBook Packages: Springer Book Archive

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