Transmission Electron Microscopy

A Textbook for Materials Science

  • David B. Williams
  • C. Barry Carter

Table of contents

  1. Front Matter
    Pages i-xxix
  2. Basics

    1. Front Matter
      Pages 1-1
    2. David B. Williams, C. Barry Carter
      Pages 3-17
    3. David B. Williams, C. Barry Carter
      Pages 19-33
    4. David B. Williams, C. Barry Carter
      Pages 35-47
    5. David B. Williams, C. Barry Carter
      Pages 49-65
    6. David B. Williams, C. Barry Carter
      Pages 67-83
    7. David B. Williams, C. Barry Carter
      Pages 85-104
    8. David B. Williams, C. Barry Carter
      Pages 105-115
    9. David B. Williams, C. Barry Carter
      Pages 117-129
    10. David B. Williams, C. Barry Carter
      Pages 131-153
    11. David B. Williams, C. Barry Carter
      Pages 155-173
  3. Diffraction

    1. Front Matter
      Pages 175-175
    2. David B. Williams, C. Barry Carter
      Pages 177-189
    3. David B. Williams, C. Barry Carter
      Pages 191-200
    4. David B. Williams, C. Barry Carter
      Pages 201-213
    5. David B. Williams, C. Barry Carter
      Pages 215-224
    6. David B. Williams, C. Barry Carter
      Pages 225-236
    7. David B. Williams, C. Barry Carter
      Pages 237-249
    8. David B. Williams, C. Barry Carter
      Pages 251-263

About this book

Introduction

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi­ of materials by completing the processing-structure-prop­ croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them­ to achieve specific sets of properties; the extraordinary abili­ selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM­ of all of these areas before one can hope to tackle signifi­ instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate­ be used with care and attention, in many cases involving rials education must include suitable courses in electron mi­ teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci­ for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Keywords

Helium-Atom-Streuung crystal diffraction electron microscope electron microscopy materials characterization microscopy transmission electron microscopy

Authors and affiliations

  • David B. Williams
    • 1
  • C. Barry Carter
    • 2
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.University of MinnesotaMinneapolisUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-2519-3
  • Copyright Information Springer-Verlag US 1996
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-306-45324-3
  • Online ISBN 978-1-4757-2519-3
  • About this book
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