Transmission Electron Microscopy

1. Front Matter

   Pages i-xxix

   PDF

2. Basics

   1. Front Matter

      Pages 1-1

      PDF

   2. The Transmission Electron Microscope

      • David B. Williams, C. Barry Carter

      Pages 3-17

   3. Scattering and Diffraction

      • David B. Williams, C. Barry Carter

      Pages 19-33

   4. Elastic Scattering

      • David B. Williams, C. Barry Carter

      Pages 35-47

   5. Inelastic Scattering and Beam Damage

      • David B. Williams, C. Barry Carter

      Pages 49-65

   6. Electron Sources

      • David B. Williams, C. Barry Carter

      Pages 67-83

   7. Lenses, Apertures, and Resolution

      • David B. Williams, C. Barry Carter

      Pages 85-104

   8. How to “See” Electrons

      • David B. Williams, C. Barry Carter

      Pages 105-115

   9. Pumps and Holders

      • David B. Williams, C. Barry Carter

      Pages 117-129

   10. The Instrument

       • David B. Williams, C. Barry Carter

       Pages 131-153

   11. Specimen Preparation

       • David B. Williams, C. Barry Carter

       Pages 155-173

3. Diffraction

   1. Front Matter

      Pages 175-175

      PDF

   2. Diffraction Patterns

      • David B. Williams, C. Barry Carter

      Pages 177-189

   3. Thinking in Reciprocal Space

      • David B. Williams, C. Barry Carter

      Pages 191-200

   4. Diffracted Beams

      • David B. Williams, C. Barry Carter

      Pages 201-213

   5. Bloch Waves

      • David B. Williams, C. Barry Carter

      Pages 215-224

   6. Dispersion Surfaces

      • David B. Williams, C. Barry Carter

      Pages 225-236

   7. Diffraction from Crystals

      • David B. Williams, C. Barry Carter

      Pages 237-249

   8. Diffraction from Small Volumes

      • David B. Williams, C. Barry Carter

      Pages 251-263

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi­ of materials by completing the processing-structure-prop­ croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them­ to achieve specific sets of properties; the extraordinary abili­ selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM­ of all of these areas before one can hope to tackle signifi­ instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate­ be used with care and attention, in many cases involving rials education must include suitable courses in electron mi­ teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci­ for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

• Helium-Atom-Streuung
• crystal
• diffraction
• electron microscope
• electron microscopy
• materials characterization
• microscopy
• transmission electron microscopy
• Biological Microscopy

`The best textbook for this audience available.'
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley

• Lehigh University, Bethlehem, USA

  David B. Williams

• University of Minnesota, Minneapolis, USA

  C. Barry Carter

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