Abstract
There are many ways to prepare specimens for the TEM. The method you choose will depend on both the type of material and the information you need to obtain. One important point to bear in mind is that your technique must not affect what you see or measure, or if it does then you must know how. Specimen preparation artifacts may be interesting but they are not usually what you want to study.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
General References
Anderson, R.M., Ed. (1990) Specimen Preparation for Transmission Electron Microscopy of Materials, II, Materials Research Society Symposium Proceedings 199, MRS, Pittsburgh, Pennsylvania.
Anderson, R.M., Tracy, B., and Bravman, J.C., Eds. (1992) Specimen Preparation for Transmission Electron Microscopy of Materials, III, Materials Research Society Symposium Proceedings 254, MRS, Pittsburgh, Pennsylvania.
Barber, D.J. (1970) J. Mater. Sci. 5, 3.
Bravman, J.C., Anderson, R.M., and McDonald, M.L., Eds. (1988) Specimen Preparation for Transmission Electron Microscopy of Materials, Materials Research Society Symposium Proceedings 115, MRS, Pittsburgh, Pennsylvania.
Echlin, P. (1992) Low Temperature Microscopy and Analysis, Plenum Press, New York. Mainly biological but useful for polymers.
Goodhew, P.J. (1984) Specimen Preparation for Transmission Electron Microscopy of Materials, Oxford University Press, New York.
Goodhew, P.J. (1985) Practical Methods in Electron Microscopy, Vol. 11: Thin Foil Preparation for Electron Microscopy, Elsevier, New York.
Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W., and Whelan, M.J. (1977) Electron Microscopy of Thin Crystals,2nd edition, Krieger, Huntington, New York. Chapter 2 and Appendix 1, the largest chapter and the largest appendix.
Humphries, D.W. (1992) The Preparation of Thin Sections of Rocks, Minerals and Ceramics, Royal Microscopical Society Handbook No. 24, Oxford University Press, New York. Although not aimed at TEM, this handbook contains many helpful ideas.
Kestel, B.J. (1986) “Polishing Methods for Metallic and Ceramic Transmission Electron Microscopy Studies,” in ANL-80–120 Rev. 1 (from Argonne National Laboratory). 66 pages of recipes and directions which have all been extensively used by Kestel.
Marcus, R.B. and Sheng, T.T. (1983) Transmission Electron Microscopy of Silicon VLSI Circuits and Structures, Wiley, New York.
Reid, N. and Beesley, J.E. (1991) Practical Methods in Electron Microscopy Vol. 13: Sectioning and Crvosectioning for Electron Microscopy, Elsevier, Amsterdam. Biological but comprehensive.
Roos, N. and Morgan, A.J. (1990) Cryoprepnration of Thin Biological Specimens for Electron Microscopy: Methods and Applications, Oxford University Press, New York. Biological again, but a good one to know.
Sawyer, L.C. and Grubb, D.T. (1987) Polymer Microscopy,Chapman and Hall, New York. Chapter 4 is 71 pages long, covering specimen preparation for SEM and TEM; –25°10 of the book.
Thomas, G. and Goringe, M.J. (1979) Transmission Electron Microscopy of Metals, p. 336, Wiley, New York.
Thompson-Russell, K.C. and Edington, J.W. (1977) Electron Microscope
Specimen Preparation Techniques in Materials Science,Macmillan, Philips Technical Library, Eindhoven, the Netherlands. Many recipes.
Specific References
Alani. R. and Swann, P.R. (1992) in Anderson et al.,op. cit., p. 43. Barna, (1992) in Anderson etal.,op. cit., p. 254.
Brown, J.M. and Sheng, T.J. (1988) in Bravman et al.,op. cit., p. 229.
Cullis, A.G., Chew, N.G., and Hutchison, J.L. (1985) Ultramicroscopy 17, 303.
Goodhew, P.J. (1988) in Bravman et al.,op. cit., p. 51.
Klepeis, S.J., Benedict, J.P., and Anderson, R.M. (1988) in Bravman et al.,op. cit., p. 179.
Malis, T.F. (1989) in Microbeam Analysis-1989 (Ed. P.E. Russell), p. 487, San Francisco Press, San Francisco.
Médard, L., Jacquet, D.A., and Sarlorius, R. (1949) Rev. Mat. 46, 549.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1996 Springer Science+Business Media New York
About this chapter
Cite this chapter
Williams, D.B., Carter, C.B. (1996). Specimen Preparation. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_10
Download citation
DOI: https://doi.org/10.1007/978-1-4757-2519-3_10
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-45324-3
Online ISBN: 978-1-4757-2519-3
eBook Packages: Springer Book Archive