Frontiers in Electronic Testing

Timing Performance of Nanometer Digital Circuits Under Process Variations

Authors:

• Victor Champac
• Jose Garcia Gervacio

• Copyright: 2018

Available Renditions

• Hard cover
• Soft cover
• eBook

Advances in Electronic Testing

Challenges and Methodologies

Editors:

• Dimitris Gizopoulos

• Copyright: 2006

Available Renditions

• Hard cover
• Soft cover
• eBook

The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

Authors:

• Francisco da Silva
• Teresa McLaurin
• Tom Waayers

• Copyright: 2006

Available Renditions

• Hard cover
• Soft cover
• eBook

Defect Oriented Testing for CMOS Analog and Digital Circuits

Authors:

• Manoj Sachdev

• Copyright: 1999

Available Renditions

• Hard cover
• eBook

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Authors:

• Said Hamdioui

• Copyright: 2004

Available Renditions

• Hard cover
• Soft cover
• eBook