Book titles in this series
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Advances in Electronic Testing
Challenges and Methodologies
- Editors:
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- Dimitris Gizopoulos
- Copyright: 2006
Available Renditions
- Hard cover
- Soft cover
- eBook
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The Core Test Wrapper Handbook
Rationale and Application of IEEE Std. 1500â„¢
- Authors:
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- Francisco da Silva
- Teresa McLaurin
- Tom Waayers
- Copyright: 2006
Available Renditions
- Hard cover
- Soft cover
- eBook
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Defect Oriented Testing for CMOS Analog and Digital Circuits
- Authors:
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- Manoj Sachdev
- Copyright: 1999
Available Renditions
- Hard cover
- eBook
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Testing Static Random Access Memories
Defects, Fault Models and Test Patterns
- Authors:
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- Said Hamdioui
- Copyright: 2004
Available Renditions
- Hard cover
- Soft cover
- eBook
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Design for AT-Speed Test, Diagnosis and Measurement
- Editors:
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- Benoit Nadeau-Dostie
- Copyright: 2000
Available Renditions
- Hard cover
- Soft cover
- eBook
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High Performance Memory Testing
Design Principles, Fault Modeling and Self-Test
- Authors:
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- R. Dean Adams
- Copyright: 2003
Available Renditions
- Hard cover
- Soft cover
- eBook
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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
- Authors:
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- Krishnendu Chakrabarty
- Copyright: 2002
Available Renditions
- Hard cover
- Soft cover
- eBook
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
- Authors:
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- M. Bushnell
- Vishwani Agrawal
- Copyright: 2002
Available Renditions
- Hard cover
- Soft cover
- eBook
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A Designer’s Guide to Built-In Self-Test
- Authors:
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- Charles E. Stroud
- Copyright: 2002
Available Renditions
- Hard cover
- Soft cover
- eBook