Influence of Ni content on the microstructure and magnetic and magneto-optical properties of sputtered (Co1-xNix)Pt3 alloy films

Solid and Condensed State Physics

Abstract.

Influence of Ni content on the microstructure and magnetic and magneto-optical (MO) properties of sputtered (Co1-xNix)Pt3 alloy films has been investigated by means of Kerr spectrometer, Kerr hysteresis looper, X-ray diffractometer (XRD), and atomic force microscopy (AFM). On the whole, the addition of Ni to the CoPt3 alloy film simultaneously decreases the Curie temperature TC and the Kerr rotation angle θK, but the decrease of TC with Ni content is more visible. When the Ni content x is increased from 0 to 0.33, TC decreases from 273 ○C to 233 ○C, whereas the decrease of θK is quite limited and the film still preserves a strong perpendicular magnetic anisotropy (PMA) and a high coercivity, indicating that the (Co1-xNix)Pt3 alloy film with x=0.33 can be used for practical MO applications. Further increase of Ni content decreases the θK significantly and destroys the PMA. XRD and AFM studies show that adding a small amount of Ni in the CoPt3 alloy film will promote the growth of grains and roughen the film surface, and thus enhance the coercivity of the film. We observe also that both the coercivity and PMA are not sensitive to the (111) preferred orientation of the (Co1-xNix )Pt3 alloy films.

Keywords

Atomic Force Microscopy Hysteresis Looper Rotation Angle Curie Temperature Prefer Orientation 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. W.B. Zeper, F.J.A.M. Greidanus, P.F. Carcia, C.R. Fincher, J. Appl. Phys. 65, 4971 (1989) Google Scholar
  2. N. Nakajima, T. Koide, T. Shidara, H. Miyauchi, H. Fukutani, A. Fujimori, K. Iio, T. Katayama, M. Nyvlt, Y. Suzuki, Phys. Rev. Lett. 81, 5229 (1998) CrossRefGoogle Scholar
  3. H. Zeng, M.L. Yan, N. Powers, D.J. Sellmyer, Appl. Phys. Lett. 80, 2350 (2002) Google Scholar
  4. C.-J. Lin, G.L. Gorman, Appl. Phys. Lett. 61, 1600 (1992) CrossRefGoogle Scholar
  5. D. Weller, H. Brandle, G. Gorman, C.-J. Lin, H. Notarys, Appl. Phys. Lett. 61, 2726 (1992) CrossRefGoogle Scholar
  6. M. Li, Z.H. Jiang, Z.Q. Zou, D.F. Shen, J. Magn. Magn. Mater. 176, 331 (1997) CrossRefGoogle Scholar
  7. W. Grange, M. Maret, J.-P. Kappler, J. Vogel, A. Fontaine, F. Petroff, G. Krill, A. Rogalev, J. Goulon, M. Finazzi, N.B. Brookes, Phys. Rev. B 58, 6298 (1998) Google Scholar
  8. K. Xun, M. Li, J. Zhou, D.F. Shen, Thin Solid Films 347, 253 (1999) CrossRefGoogle Scholar
  9. G. Srinivas, S.-C. Shin, Appl. Phys. Lett. 69, 3086 (1996) CrossRefGoogle Scholar
  10. P.W. Rooney, A.L. Shapiro, M.Q. Tran, F. Hellman, Phys. Rev. Lett. 75, 1843 (1995) PubMedGoogle Scholar
  11. A.L. Shapiro, P.W. Rooney, M.Q. Tran, F. Heilman, J. Appl. Phys. 81, 5053 (1997) Google Scholar
  12. J.-G. Ha, K. Kyuno, R. Yamamoto, IEEE Trans. Magn. 33, 1049 (1997) CrossRefGoogle Scholar
  13. S. Hashimoto, J. Appl. Phys. 75, 438 (1994) CrossRefGoogle Scholar
  14. T. Shirakawa, K. Okamoto, K. Onishi, S. Matsushita, Y. Sakurai, IEEE Trans. Magn. MAG-10, 795 (1974) Google Scholar
  15. J. Zhou, G.Q. Xia, K. Xun, Y.J. Zhang, S.Y. Liu, L.Y. Chen, D.F. Shen, Appl. Phys. A 70, 453 (2000) CrossRefGoogle Scholar
  16. T.H. Kim, M.C. Cadeville, A. Dinia, Phys. Rev. B 53, 221 (1996) CrossRefGoogle Scholar
  17. S. Basu, S.K. Ghatak, J. Magn. Magn. Mater. 123, 97 (1993) CrossRefGoogle Scholar
  18. M. Mansuripur, M.F. Ruane, IEEE Trans. Magn. MAG-22, 33 (1986) Google Scholar
  19. R. Hajjar, M. Mansuripur, IEEE Trans. Magn. MAG-25, 4021 (1989) Google Scholar
  20. S.C. Shin, G. Srinivas, Y.S. Kim, M.G. Kim, Appl. Phys. Lett. 73, 393 (1998) CrossRefGoogle Scholar
  21. M. Hansen, K. Andreiko, Handbook of Binary Alloys (McGraw-Hill, New York, 1985) Google Scholar
  22. R.E. Parra, J.W. Cable, J. Appl. Phys. 50, 7522 (1979) CrossRefGoogle Scholar
  23. T.H. Kim, M.C. Cadeville, A. Dinia, V. Pierron-Bohnes, H. Rakoto, Phys. Rev. B 54, 3408 (1996) CrossRefGoogle Scholar
  24. M. Maret, M.C. Cadeville, A. Herr, R. Poinsot, E. Beaurepaire, S. Lefebvre, M. Bessiere, J. Magn. Magn. Mater. 191, 61 (1999) CrossRefGoogle Scholar
  25. T.C. Huang, R. Savoy, R.F.C. Farrow, R.F. Marks, Appl. Phys. Lett. 62, 1353 (1993) Google Scholar
  26. J.-P. Hu, P. Lin, IEEE Trans. Magn. MAG-32, 4096 (1996) Google Scholar
  27. T.A. Tyson, S.D. Conradson, R.F.C. Farrow, B.A. Jones, Phys. Rev. B 54, R3702 (1996) Google Scholar
  28. W.F. Brown, Rev. Mod. Phys. 17, 15 (1945) CrossRefGoogle Scholar
  29. T. Suzuki, H. Notarys, D.C. Dobbertin, C.J. Lin, D. Weller, D.C. Miller, G. Gorman, IEEE Trans. Magn. MAG-28, 2754 (1992) Google Scholar

Copyright information

© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Authors and Affiliations

  • Z. Q. Zou
    • 1
  • H. Wang
    • 1
  • J. Zhou
    • 2
  • D. F. Shen
    • 2
  • Y. P. Lee
    • 3
  1. 1.Instrumental Analysis Center, Shanghai Jiaotong UniversityShanghaiChina
  2. 2.Shanghai Institute of Metallurgy, Chinese Academy of SciencesShanghaiChina
  3. 3.Department of PhysicsHanyang UniversitySeoulKorea

Personalised recommendations