Abstract
The melt-crystal (m-c) interface shape and impurities distribution in multi-crystalline silicon (mc-Si) were investigated in Directional Solidification (DS) method. The two different heater designs with DS were investigated by using numerical analysis. The modified multiple-heaters (MMH) have lower surface area compared to the conventional multiple-heaters (CMH). Carbon comes from the heated graphite surface, oxygen originates from the crucible. Carbon and oxygen are strongly correlated with gaseous SiO and CO. Collision of gaseous SiO2- molecules with graphite surface generates SiO and CO gases during the growth process. The CMH produced more carbon atoms in the solidification process and also it gives more convex m-c interface shape. The MMH produced fewer carbon atoms compared to the CMH and also it gives slightly convex m-c interface shape. The MMH has reduced the carbon and oxygen in the silicon ingot. And also, it has reduced gaseous impurities in the solidification process. So, we have concluded that modified heater may reduce the impurities in the grown mc-Si.
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This work is supported by the Ministry of New and Renewable Energy (MNRE), the Government of India (Order No: 31/58/2013-2014/PVSE2).
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Kesavan, V., Srinivasan, M. & Ramasamy, P. The Influence of Multiple-Heaters on the Reduction of Impurities in mc-Si for Directional Solidification. Silicon 11, 1335–1344 (2019). https://doi.org/10.1007/s12633-018-9928-7
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DOI: https://doi.org/10.1007/s12633-018-9928-7