Journal of Electronic Testing

, Volume 23, Issue 1, pp 35–45 | Cite as

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

  • Grzegorz Mrugalski
  • Janusz Rajski
  • Chen Wang
  • Artur Pogiel
  • Jerzy Tyszer


This paper describes a non-recursive fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss–Jordan elimination method.


convolutional compactors fault diagnosis scan-based designs test response compaction 


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Copyright information

© Springer Science + Business Media, LLC 2007

Authors and Affiliations

  • Grzegorz Mrugalski
    • 1
  • Janusz Rajski
    • 1
  • Chen Wang
    • 1
  • Artur Pogiel
    • 2
  • Jerzy Tyszer
    • 2
  1. 1.Mentor Graphics CorporationWilsonvilleUSA
  2. 2.Poznań University of TechnologyPoznańPoland

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