Journal of Electronic Testing
Theory and Applications
The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.
A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.
In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.
Vishwani D. Agrawal (September 2018)
Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission
Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System
- Journal Title
- Journal of Electronic Testing
- Volume 1 / 1990 - Volume 34 / 2018
- Print ISSN
- Online ISSN
- Springer US
- Additional Links
- Industry Sectors
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