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Journal of Electronic Testing

, Volume 21, Issue 5, pp 461–462 | Cite as

The Newsletter of Test Technology Council of the IEEE Computer Society

  • Bruce Kim
Article
  • 112 Downloads

Keywords

IEEE Computer Society Test Technology Technology Council 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Bruce Kim

There are no affiliations available

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