Abstract
Contact-based recording on ferroelectric media and polymer media have been proposed and investigated for high-density probe storage. To achieve fast data rate, it is necessary to perform reading or writing with multiple probe heads simultaneously. However, localized variations in tribological behavior at the contact interface between the probes and recording media and variation in normal contact force would result in variation in friction and stiction over the interface and therefore amongst individual heads in the probe head array. This causes variation in the hysteretic motion of the heads over the array, which in turn results in off-track motion during track-positioning and timing errors during scanning. In this paper a novel method of modeling these effects is developed to study the effect of relative head-motion hysteresis (RHMH) on timing-error during data read–write and off-track errors during seek-settle. A mathematical model of RHMH during scanning along the bit-wise direction is developed based on the idea of stochastic averaging. A transient response model is similarly developed for estimating hysteresis effects during seek-settle. These models help to understand parametric dependencies of RHMH and can be used in designing the probe heads, the probe–media interface (PMI) and the probe system in general. Further several schemes involving modulation of the normal force at the PMI are proposed to mitigate RHMH and their benefits are analyzed using the models described in this paper.
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Abbreviations
- PMI:
-
Probe–media interface
- RHMH:
-
Relative head-motion hysteresis
- SDE:
-
Stochastic differential equation
- PMC:
-
Probe–media contact
- DOF:
-
Degree-of-freedom
References
Bouhacina T, Aime JP, Gauthier S, Michel D, Heroguez V (1997) Tribological behavior of a polymer grafted on silanized silica probed with a nanotip. Phys Rev B 56(12):7694–7903. doi:10.1103/PhysRevB.56.7694
Cho Y, Hashimoto S, Odagawa N, Tanaka K, Hiranaga Y (2006) Nanodomain manipulation for ultrahigh density ferroelectric data storage. Nanotechnology 17:S137–S141. doi:10.1088/0957-4484/17/7/S06
Dienweibel M, Verhoeven GS, Pradeep N, Frenken JWM (2004) Superlubricity of graphite. Phys Rev Lett 92(12):126101-1–126101-4
Dinelli F, Biswas SK, Briggs GAD, Kolosov OV (1997) Ultrasound induced lubricity in microscopic contact. Appl Phys Lett 71(9):1177–1179. doi:10.1063/1.120417
Eleftheriou E et al (2003) Millipede-A MEMS-based scanning-probe data-storage system. IEEE Trans Magn 39(2):938. doi:10.1109/TMAG.2003.808953
Feller W (1954) Diffusion processes in one dimension. Trans Am Math Soc 77:1–31. doi:10.2307/1990677
Gao J, Luedtke WD, Landman U (1998) Friction control in thin-film lubrication. J Phys Chem B 102:5033–5037. doi:10.1021/jp982150q
Hiranaga Y, Tanaka K, Cho Y (2006) Nanodomain manipulation for reduction of bit error rate in terabit/inch2—class ferroelectric data storage. Jpn J Appl Phys 45(3B):2220–2224. doi:10.1143/JJAP.45.2220
Karlin S, Taylor HM (1972) A second course in stochastic processes. Academic Press, New York
Khas’minskii RZ (1968) On the principles of averaging for Ito stochastic differential equations. Kybernetica 4:260–279
Krylov SY, Jinesh KB, Valk H, Dienwiebel M, Frenken JWM (2005) Thermally induced suppression of friction at the atomic scale. Phys Rev E 71:065101-1–065101-4
Lutwyche MI (2000) Highly parallel data storage system based on scanning probe arrays. Appl Phys Lett 77(20):3299–3301. doi:10.1063/1.1326486
Meirowitch L (1986) Elements of vibration analysis. McGraw Hill, New York
Namachchivaya NS, Ramakrishnan N (2003) Stochastic dynamics of parametrically excited two d.o.f systems with symmetry. J Sound Vib 262:613–631. doi:10.1016/S0022-460X(03)00114-7
Oksendal BK (1998) Stochastic differential equations—an introduction with applications. Springer, New York
Riedo E, Gnecco E, Bennewitz R, Meyer R, Brune H (2003) Interaction potential and hopping dynamics governing sliding friction. Phys Rev Lett 91(8):084502-1–084502-4
Sang Y, Dube M, Grant M (2001) Thermal effects on atomic friction. Phys Rev Lett 87(17):174301-1–174301-4
Socoliuc A, Bennewitz R, Gnecco E, Meyer E (2004) Transition from stick-slip to continuous sliding in atomic friction: entering a new regime of ultralow friction. Phys Rev Lett 92(13):134301-1–134301-4
Socoliuc A, Gnecco E, Maier S, Pfeiffer O, Baratoff A, Bennewitz R, Meyer E (2006) Atomic-scale control of friction by actuation of nanometer-sized contact. Science 313:207–210. doi:10.1126/science.1125874
Takahashi H, Onoe A, Ono T, Cho Y, Esashi M (2006) High-density ferroelectric recording using diamond probe by scanning nonlinear dielectric microscopy. Jpn J Appl Phys 45(3A):1530–1533. doi:10.1143/JJAP.45.1530
Urbakh M, Klafter J, Gourdon D, Israelachvilli J (2004) The nonlinear nature of friction. Nature 430:525–528. doi:10.1038/nature02750
Wong E (1971) Stochastic processes in information and dynamical systems. McGraw-Hill, New York
Yoshida S, Ono T, Oi S, Esashi M (2005) Reversible electrical modification on conductive polymer for scanning multiprobe data storage. In: Proceedings of the 13th international conference on solid-state sensors, actuators and microsystems, Transducers’05, Seoul Korea, pp 1300–1303
Acknowledgments
The authors would like to acknowledge and thank Patrick Chu, Earl Johns, John Stricklin and James Kiely for suggestions and Seagate Technology for supporting this work. Special thanks are due to Martin Forrester and Ju-il Lee for reviewing this manuscript and for providing useful suggestions.
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Appendix A: Governing SDE in amplitude-phase form
Appendix A: Governing SDE in amplitude-phase form
The governing SDE in the amplitude-phase variables (a, ϕ) is given by Eq. 7. Carrying out the stochastic averaging calculations described in Sect. 2.1, the terms on the right-hand-side of Eq. 7 can be obtained as
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Ramakrishnan, N., Bedillion, M.D. A novel study of head motion hysteresis issues in contact probe recording systems. Microsyst Technol 15, 595–606 (2009). https://doi.org/10.1007/s00542-008-0757-2
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DOI: https://doi.org/10.1007/s00542-008-0757-2