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Magnetic Domain Imaging with Spin-Polarized SEM

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Handbook of Spintronics

Abstract

In spintronics research, high-spatial-resolution, quantitative, (and in some cases) low-temperature observation of magnetic domains together with elements and crystal-direction distribution is important. As per this point of view, spin-polarized scanning electron microscopy is a significantly powerful method. In this chapter, the principle, apparatus, capabilities and some representative applications of this microscopy method are described.

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Abbreviations

ASTM:

American Society for Testing and Materials

EBSD:

Electron backscattering diffraction

SAM:

Scanning Auger microscopy or scanning Auger microscope

spin-SEM:

spin-polarized scanning microscopy or spin-polarized scanning microscope

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Author information

Authors and Affiliations

  1. Department of Condensed Matter of Physics, Graduate School of Science, Hokkaido University, 060-0810, Kita10, Nishi8, Kita-ku, Sapporo, Japan

    Kazuyuki Koike

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  1. Kazuyuki Koike
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Correspondence to Kazuyuki Koike .

Editor information

Editors and Affiliations

  1. York-Nanjing International Center of Spintronics, Nanjing University, Nanjing, China

    Yongbing Xu

  2. Institute for Molecular Engineering, University of Chicago, Chicago, Illinois, USA

    David D. Awschalom

  3. Department of Materials Science, Graduate School of Engineering, Tohoku University, Sendai, Japan

    Junsaku Nitta

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Koike, K. (2016). Magnetic Domain Imaging with Spin-Polarized SEM. In: Xu, Y., Awschalom, D., Nitta, J. (eds) Handbook of Spintronics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-6892-5_34

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