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Surface Plasmon-Enhanced Super-Localization Microscopy

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Handbook of Photonics for Biomedical Engineering

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Abstract

Super-resolution microscopy has drawn tremendous interests because it allows precise tracking of molecular interactions and observation of dynamics on a nanometer scale. Intracellular and extracellular processes can be measured at the molecular level; thus, super-resolution techniques help in the understanding of biomolecular events in cellular and sub-cellular conditions and have been applied to many areas such as cellular and molecular analysis and ex vivo and in vivo observation.

In this chapter, we review near-field imaging that relies on evanescent waves such as TIRFM with an emphasis on super-resolution microscopy techniques that emerge recently based on excitation and localization of SP. In particular, three approaches are detailed: firstly, SUPRA imaging that employs the electromagnetic localization of near-fields by random nanopatterns; secondly, NLS that capitalizes on nanoscale fluorescence sampling at periodic nanoapertures; and finally, PSALM that depends on temporal switching of amplified local fields for enhancement of imaging resolution. The resolution typically achieved by these techniques is laterally below 100 nm and closely related to the size of a near-field hot spot and nanostructures used to localize SP. We expect the achievable imaging resolution to decrease significantly in the near future.

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Abbreviations

AFM:

Atomic force microscopy

FDTD:

Finite-difference time domain

FWHM:

Full width at half maximum

NA:

Numerical aperture

NLS:

Nanoscale localization sampling

PALM:

Photo-activated localization microscopy

PSALM:

Plasmonics-based spatially activated light microscopy

PSF:

Point-spread function

PSIM:

Plasmonic structured illumination microscopy

RCWA:

Rigorous coupled-wave analysis

SEM:

Scanning electron microscopy

SIM:

Structured illumination microscopy

SP:

Surface plasmon

SPM:

Surface plasmon microscopy

SPP:

Surface plasmon polariton

SPR:

Surface plasmon resonance

SPRi:

Surface plasmon resonance imaging

STED:

Stimulated emission depletion

STORM:

Stochastic optical reconstruction microscopy

SUPRA:

SP-enhanced random activation

TIR:

Total internal reflection

TIRF:

Total internal reflection fluorescence

TIRFM:

Total internal reflection fluorescence microscopy

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Authors and Affiliations

  1. School of Electrical and Electronic Engineering, Yonsei University, 50 Yonsei-ro, Sinchon-dong, Seodaemun-gu, 120-749, Seoul, Republic of Korea

    Youngjin Oh, Jong-ryul Choi, Wonju Lee & Donghyun Kim

  2. Medical Device Development Center, Daegu-Gyeongbuk Medical Innovation Foundation(DGMIF), Daegu, South Korea

    Jong-ryul Choi

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  1. Youngjin Oh
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  2. Jong-ryul Choi
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  3. Wonju Lee
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  4. Donghyun Kim
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Correspondence to Donghyun Kim .

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Editors and Affiliations

  1. Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, Hong Kong

    Aaron Ho-Pui Ho

  2. School of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea (Republic of)

    Donghyun Kim

  3. Department of Electronic and Information Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong

    Michael G. Somekh

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Oh, Y., Choi, Jr., Lee, W., Kim, D. (2017). Surface Plasmon-Enhanced Super-Localization Microscopy. In: Ho, AP., Kim, D., Somekh, M. (eds) Handbook of Photonics for Biomedical Engineering. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-5052-4_4

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