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Atomic force microscopy, often abbreviated as AFM, is one of the elected techniques for fine surface and geometrical characterization. Atomic force microscopes provide three-dimensional reconstruction of surface topographies with sub-nanometer vertical and lateral resolution, over a range which is typically no larger than a few tens or hundreds of micrometers.
Atomic force microscopes belong to the family of scanning probe microscopy (SPM), a branch of microscopy allowing imaging of surfaces by means of a physical probe scanning the sample surface. SPMs monitor the interaction between the probe and the surface to produce an image or a three-dimensional reconstruction of the surface. SPMs classification is based on the specific physical principles causing the interaction (e.g., Marinello et al. 2010, 2014). When such interaction is a force (magnetic, electrostatic, friction, etc.), the scanning probe microscopes are also classified as...
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References
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Marinello F, Schiavuta P, Carmignato S, Savio E (2010) Critical factors in quantitative atomic force acoustic microscopy. CIRP J Manuf Sci Technol 3(1):49–54
Marinello F, Schiavuta P, Cavalli R, Pezzuolo A, Carmignato S, Savio E (2014) Critical factors in cantilever near-field scanning optical microscopy. IEEE Sensors J 14(9):3236–3244
Steffens C, Leite FL, Bueno CC, Manzoli A, Herrmann PSP (2012) Atomic force microscopy as a tool applied to nano/biosensors. Sensors 12(6):8278–8300
Yacoot A, Koenders L (2011) Recent developments in dimensional nanometrology using AFMs. Meas Sci Technol 22(12):122001
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Marinello, F. (2016). Atomic Force Microscopy. In: The International Academy for Produ, Laperrière, L., Reinhart, G. (eds) CIRP Encyclopedia of Production Engineering. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-35950-7_6577-3
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DOI: https://doi.org/10.1007/978-3-642-35950-7_6577-3
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