Abstract
Radiation damage is an important issue for the particle detectors operated in a hostile environment where radiations from various sources are expected. This is particularly important for high energy physics detectors designed for the energy and intensity frontiers. This chapter describes the radiation damage effects in scintillating crystals, including the scintillation-mechanism damage, the radiation-induced phosphorescence, and the radiation-induced absorption. The radiation damage mechanism in crystal scintillators is also discussed. While the damage in halides is attributed to the oxygen/hydroxyl contamination, it is the structure defects, such as the oxygen vacancies, which cause the damage in oxides. Various material analysis methods used in investigations of the radiation damage effects as well as the improvement of crystal quality through systematic R&D are also presented.
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Further Reading
Claeys C, Simoen E (2002) Radiation effects in advanced semiconductor materials and devices. Springer, Berlin
Grupen C, Shwartz B (2008) Particle detectors. Cambridge University Press, Cambridge
Holmes-Siedle A, Adams L (2002) Handbook of radiation effects. Oxford University Press, Oxford
Iniewski K (2010) Radiation effects in semiconductors. CRC Press, Boca Raton
Knoll G (2000) Radiation detection and measurement, 3rd edn. Wiley, New York
Lecoq P, Annekov A, Gektin A, Korzhik M, Pedrini C (2005) Inorganic scintillators for detector systems. Springer-Verlag, Berlin, Heidelberg
Acknowledgments
Measurements at Caltech were carried out by Drs. J.M. Chen, Q. Deng, H Wu, D.A. Ma, R.H. Mao, X.D. Qu and L.Y. Zhang. This work was supported in part by the US Department of Energy under grant DE-FG03-92-ER-40701 and the US National Science Foundation Award PHY-0612805.
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Zhu, RY. (2012). Radiation Damage Effects. In: Grupen, C., Buvat, I. (eds) Handbook of Particle Detection and Imaging. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-13271-1_22
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