Abstract
Measurements of the chemical compositions of materials and the levels of certain substances in them are vital when assessing and improving public health, safety and the environment, are necessary to ensure trade equity, and are required when monitoring and improving industrial products and services. Chemical measurements play a crucial role in most areas of the economy, including healthcare, food and nutrition, agriculture, environmental technologies, chemicals and materials, instrumentation, electronics, forensics, energy, and transportation.
This chapter presents a broad overview of the analytical techniques that can be used to perform the “higher order chemical characterization of materials”. Techniques covered include mass spectrometry, molecular spectrometry, atomic spectrometry, nuclear analytical methods, chromatographic methods and classical chemical methods.
For each technique, information is provided on the principle(s) of operation, the scope of the technique, the nature of the sample that can be used, qualitative analysis, traceable quantitative analysis, and key references. Examples of representative data are provided for each technique, where possible.
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Abbreviations
- AED:
-
atomic emission detector
- AES:
-
Auger electron spectroscopy
- APCI:
-
atmospheric pressure chemical ionization
- ASTM:
-
American Society for Testing and Materials
- ATR:
-
attenuated total reflection
- BLRF:
-
bispectral luminescence radiance factor
- CCD:
-
digitized with charge-coupled device
- CE:
-
capillary electrophoresis
- CE:
-
counter electrode
- CIEF:
-
capillary isoelectric focusing
- CITP:
-
capillary isotachophoresis
- CMA:
-
cylindrical mirror analyzer
- CPAA:
-
charged particle activation analysis
- CRM:
-
certified reference material
- CTD:
-
charge transfer device
- CW:
-
continuous wave
- CZE:
-
capillary zone electrophoresis
- DC:
-
direct-current
- ECD:
-
electron capture detector
- EDS:
-
energy-dispersive spectrometer
- EELS:
-
electron energy-loss spectroscopy
- ELSD:
-
evaporative light scattering detector
- EPMA:
-
electron probe microanalysis
- ESEM:
-
environmental scanning electron microscope
- FIB:
-
focused ion beam
- FID:
-
flame ionization detector
- FID:
-
free-induction decay
- FNAA:
-
neutron activation analysis
- FPD:
-
flame photometric detector
- FT:
-
Fourier transform
- GC-IR:
-
gas chromatography–infrared
- GC:
-
gas chromatography
- GSED:
-
gaseous secondary electron detector
- HSA:
-
hemispherical analyzer
- ICP-OES:
-
ICP optical emission spectrometry
- ICP:
-
inductively coupled plasma
- ICR:
-
ion cyclotron resonance
- IR:
-
infrared region
- ISO:
-
International Organization for Standardization
- LC:
-
liquid chromatography
- LED:
-
light-emitting diode
- MDM:
-
minimum detectable mass
- MLLSQ:
-
multiple linear least squares
- MMF:
-
minimum mass fraction
- MS:
-
mass spectrometer
- NAA:
-
neutron activation analysis
- NDP:
-
neutron depth profiling
- NIR:
-
near infrared
- NIST:
-
National Institute of Standards and Technology
- NMI:
-
National Metrology Institute
- NMR:
-
nuclear magnetic resonance
- ODS:
-
octadecylsilane
- OES:
-
optical emission spectrometry
- PAH:
-
polycyclic aromatic hydrocarbon
- PID:
-
photoionization detector
- PIXE:
-
particle-induced X-ray emission
- PMT:
-
photomultiplier tube
- PTFE:
-
polytetrafluoroethylene
- RF:
-
radiofrequency
- RPLC:
-
reversed-phase liquid chromatography
- RSF:
-
relative sensitivity factor
- S/N:
-
signal-to-noise ratio
- SDD:
-
silicon drift detector
- SEM:
-
scanning electron microscope
- SRE:
-
stray radiant energy
- STEM:
-
scanning transmission electron microscope
- TCD:
-
thermal conductivity detector
- TEM:
-
transmission electron microscope
- TGA-IR:
-
thermal gravimetric analysis–infrared
- TMS:
-
tetramethylsilane
- TOF:
-
time-of-flight
- UHV:
-
ultrahigh vacuum
- UVSG:
-
UV Spectrometry Group
- WDS:
-
wavelength dispersive spectrometer
- XRF:
-
X-ray-fluorescence
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May, W. et al. (2006). Chemical Composition. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Materials Measurement Methods. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30300-8_4
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