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Optical Properties

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Book cover Springer Handbook of Materials Measurement Methods

Part of the book series: Springer Handbooks ((SHB))

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Abstract

At present, optical measurement methods are the most powerful tools for basic and applied research and inspection of the characteristic properties of a variety of materials, especially following the development of lasers and computers. Optical measurement methods are widely used for optical spectroscopy including linear and nonlinear optics and magneto-optics, conventional and unconventional optical microscopy, fiber optics for passive and active devices, optical recording for CD/DVD and MO disks, and various kinds of optical sensing.

In this chapter, as an introduction to the following sections, the concept and fundamentals of optical spectroscopy are described in Sect. 11.1, including optical measurement tools such as light sources, detectors and spectrometers, and standard optical measurement methods such as reflection, absorption, luminescence, scattering, etc. A short summary of laser instruments is also included. In Sect. 11.2 the micro-spectroscopic methods that have recently become quite useful for nano-science and nano-technology are described, including single-dot/molecule spectroscopy, near-field optical spectroscopy and cathodo-luminescence spectroscopy using scanning electron microscopes. In Sect. 11.3 magneto-optics such as Faraday rotation is introduced and the superlattice of semi-magnetic semiconductors is applied for the imaging measurement of magnetic flux patters of superconductors as an example of spintronics. Sect. 11.4 is devoted to fascinating subjects in laser spectroscopy, such as nonlinear spectroscopy, time-resolved spectroscopy and THz spectroscopy. In Sect. 11.5 fiber optics is summarized, including transmission properties, nonlinear optical properties, fiber gratings, photonic crystal fibers, etc. In Sect. 11.6 optical recording technology for high-density storage is described in detail, including the measurement methods for the characteristic properties of phase-change and magneto-optical materials. Finally, in Sect. 11.7 a variety of optical sensing methods are described, including the measurement of distance, displacement, three-dimensional shape, flow, temperature and, finally, the human body for bioscience and biotechnology.

This chapter begins with a section on basic technology for optical measurements. Sections 11.2–11.4 deal with advanced technology for optical measurements. Finally Sections 11.5–11.7 discuss practical applications to photonic devices.

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Abbreviations

AES:

Auger electron spectroscopy

AFM:

atomic force microscopy

APD:

avalanche photodiode

ASE:

amplified spontaneous emission

CCD:

digitized with charge-coupled device

CFD:

computational fluid dynamics

CL:

cathodoluminescence

CW:

continuous wave

DC:

direct-current

DFG:

difference-frequency generation

DSC:

differential scanning calorimetry

EL:

electroluminescence

EPMA:

electron probe microanalysis

FTS:

Fourier transform spectrometer

FWM:

four-wave mixing

GVD:

group velocity dispersion

HGW:

hollow grass waveguide

ICP:

inductively coupled plasma

IR:

infrared region

LC:

liquid chromatography

LD:

laser diode

LDV:

laser Doppler velocimeter

LED:

light-emitting diode

LIF:

laser-induced fluorescence

MD:

multichannel detector

MOS:

metal–oxide–semiconductor

NEP:

noise-equivalent power

OKE:

optical Kerr effect

OPG:

optical parametric generation

OPO:

optical parametric oscillator

OR:

optical rectification

OTDR:

optical time-domain reflectometry

PC:

photoconductive

PEM:

photoelectromagnetic

PL:

photoluminescence

PMT:

photomultiplier tube

PT:

phototube

PV:

photovoltaic

RE:

reference electrode

RH:

relative humidity

SBS:

sick-building syndrome

SBS:

stimulated Brillouin scattering

SEM:

scanning electron microscope

SFG:

sum-frequency generation

SHG:

second-harmonic generation

SNOM:

scanning near-field optical microscopy

SRS:

stimulated Raman scattering

TAC:

time-to-amplitude converter

TCSPC:

time-correlated single-photon counting

TDS:

total dissolved solids

TEM:

transmission electron microscope

THG:

third-harmonic generation

TPA:

two-photon absorption

VSM:

vibrating-sample magnetometer

WDM:

wavelength division multiplexing

XPS:

X-ray photoelectron spectroscopy

XRD:

X-ray diffraction

YAG:

yttrium aluminium garnet

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Authors and Affiliations

  1. Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University, 1-3, Machikaneyama-cho, Toyonaka, 560-8531, Osaka, Japan

    Tadashi Itoh Prof.

  2. Graduate School of Engineering Science, Osaka University, Machikaneyama, Toyonaka, 560-8531, Osaka, Japan

    Tsutomu Araki Prof.

  3. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Osaka, Japan

    Masaaki Ashida Ph.D.

  4. Department of Mechanical Engineering, The University of Tokushima, 2-1, Minami-Jyosanjima, 770-8506, Tokushima, Japan

    Tetsuo Iwata Prof.

  5. Faculty of Science, Department of Physics, Chiba University, 1-33 Yayoi-cho, Inage-ku, 283-8522, Chiba, Japan

    Kiyofumi Muro Prof.

  6. Optical Media Group, Storage Media Sysytems Development Center, Matsushita Electric Industrial Company, Ltd., 3-1-1 Yagumo-Nakamachi, 570-8501, Moriguchi, Japan

    Noboru Yamada Dr.

Authors
  1. Tadashi Itoh Prof.
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  2. Tsutomu Araki Prof.
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  3. Masaaki Ashida Ph.D.
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  4. Tetsuo Iwata Prof.
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  5. Kiyofumi Muro Prof.
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  6. Noboru Yamada Dr.
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Corresponding authors

Correspondence to Tadashi Itoh Prof. , Tsutomu Araki Prof. , Masaaki Ashida Ph.D. , Tetsuo Iwata Prof. , Kiyofumi Muro Prof. or Noboru Yamada Dr. .

Editor information

Editors and Affiliations

  1. Department of Electrical Engineering and Precision Engineering, University of Applied Sciences, TFH Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, US

    Leslie Smith

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© 2006 Springer-Verlag

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Itoh, T., Araki, T., Ashida, M., Iwata, T., Muro, K., Yamada, N. (2006). Optical Properties. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Materials Measurement Methods. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30300-8_11

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