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Free-Electron Laser Beam Instrumentation and Diagnostics

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Synchrotron Light Sources and Free-Electron Lasers

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Abstract

Beam instrumentation and diagnostics for FEL user facilities have to provide single-shot and shot-to-shot information about all relevant beam parameters such as beam charge, transmission, transverse beam position and profile as well as beam energy and energy spread, bunch compression, bunch length and arrival time. The diagnostics systems have to be designed such that they support accelerator set-up and commissioning as well as user operation. Non-invasive monitors are used in beam-based feedbacks that stabilize the photon yield for user experiments. This article provides a layout of beam diagnostics for an FEL user facility and describes the technical realization of the most important beam instrumentation devices, including examples of the latest achievements.

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Author information

Authors and Affiliations

  1. Paul Scherrer Institut, 5232, Villigen, Switzerland

    Volker Schlott

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  1. Volker Schlott
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Correspondence to Volker Schlott .

Editor information

Editors and Affiliations

  1. Helmholtz-Zentrum Berlin, Berlin, Germany

    Eberhard Jaeschke

  2. Zentrum für Synchrotronstrahlung, TU Dortmund, Dortmund, Germany

    Shaukat Khan

  3. FS-CFEL-1, DESY, Hamburg, Germany

    Jochen R. Schneider

  4. SLAC National Accelerator Laboratory Linac Coherent Light Source, Stanford University, Menlo Park, California, USA

    Jerome B. Hastings

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Schlott, V. (2015). Free-Electron Laser Beam Instrumentation and Diagnostics. In: Jaeschke, E., Khan, S., Schneider, J., Hastings, J. (eds) Synchrotron Light Sources and Free-Electron Lasers. Springer, Cham. https://doi.org/10.1007/978-3-319-04507-8_18-2

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  • DOI: https://doi.org/10.1007/978-3-319-04507-8_18-2

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  • Online ISBN: 978-3-319-04507-8

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Chapter history

  1. Latest

    Free-Electron Laser Beam Instrumentation and Diagnostics
    Published:
    23 January 2016

    DOI: https://doi.org/10.1007/978-3-319-04507-8_18-2

  2. Original

    FEL Beam Instrumentation and Diagnostics
    Published:
    20 August 2015

    DOI: https://doi.org/10.1007/978-3-319-04507-8_18-1

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