Abstract
Focused ion beam has become an increasingly popular tool for the manufacturing of various types of micro-/nanostructures and devices for different applications. In this chapter, the recent developments of the FIB technologies in the micro/nano manufacturing are presented in details. FIB technologies mainly involve four main approaches: imaging, milling, ion-induced deposition, and implantation. The working principle and key techniques underlying the four approaches are introduced with an emphasis on their abilities in micro-/nanofabrications. The application fields involving using the FIB micro-/nanofabrication technologies are also presented, such as micro optical elements, plasmonic lenses, etc. Concluding remarks and outlook of the future research on the FIB technologies in micro/nano manufacturing are provided at the end of the chapter.
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References
Adams DP, Vasile MJ (2006) Accurate focused ion beam sculpting of silicon using a variable pixel dwell time approach. J Vac Sci Technol B 24:836–844
Allen DM, Shore P, Evans RW, Fanara C, Brien WO, Marson S, Neill WO (2009) Ion beam, focused ion beam, and plasma discharge machining. Ann CIRP 58:647–662
Arshak K, Mihov M, Arshak A, McDonagh D and Sutton D (2004) Novel dry-developed focused ion beam lithography scheme for nanostructure applications Microelectron Eng 73–74, 144–51
Breaux GA, Benirschke RC, Sugai T, Kinnear BS, Jarrold MF (2003) Hot and solid gallium clusters: too small to melt. Phys Rev Lett 91:215508
Chih JL, Aref T, Bezryadin A (2006) Fabrication of symmetric sub-5 nm nanopores using focused ion and electron beams. Nanotechnology 17:3264–3267
Cui Z (2005) Micro-nanofabrication-technologies and applications. Higher Education Press, Beijing
Chouffani K, and Überall H (1999) Theory of Low Energy Channeling Radiation: Application to a Germanium Crystal, Phys. Stat. Sol. B 213–107.
Deng ZF, Yenilmez E, Reilein A, Leu J, Dai HJ, Moler KA (2006) Nanotube manipulation with focused ion beam. Appl Phys Lett 88:023119
Ding XG, Lim C, Cheng CK, Butler DL, Shaw KC, Liu K, Fong WS (2008) Fabrication of a micro-size diamond tool using a focused ion beam. J Micromech Microeng 18:075017
Fang N, Lee H, Sun C, Zhang X (2005) Sub–diffraction-limited optical imaging with a silver superlens. Science 308:534–537
Fang FZ, Zhang XD, and Hu XT (2008) Cylindrical Coordinate Machining of Optical Freeform Surfaces, Opt. Express 16:7323–7329
Fang FZ, Xu ZW, Zhang GX, Hu XT (2009) Fabrication and configuration of carbon nanotube probes in atomic force microscopy. Ann CIRP 58:455–458
Fang FZ, Xu ZW, Hu XT, Wang CT, Luo XJ, Fu YQ (2010a) Nano-photomask fabrication using focused ion beam direct writing. CIRP Ann Manuf Technol 59:543–546
Fang HC, Huang JH, Chu WH, Liu CP (2010b) Ga+ focused-ion-beam implantation-induced masking for H2 etching of ZnO films. Nanotechnology 21:505703
Fu YQ, Bryan NKA (2004a) Fabrication of three-dimensional microstructures by two-dimensional slice-by-slice approaching via focused ion beam milling. J Vac Sci Technol B 22:1672–1678
Fu YQ, Bryan NKA (2004b) Influence of astigmatism on the fabrication of diffractive structures by use of focused ion beam milling. Opt Express 12(17):3954–3966
Fu YQ, Zhou XL (2010) Plasmonic lenses: a review. Plasmonics 5:287–310
Fu YQ, Bryan NKA, Huang OA, Shing ON (2000) Experimental study of three-dimensional microfabrication by focused ion beam technology. Rev Sci Instrum 71:1006–1008
Fu YQ, Liu Y, Zhou XL, Xu ZW, Fang FZ (2010) Experimental investigation of superfocusing of plasmonic lens with chirped circular nanoslits. Opt Express 18:3438–3443
Gramotnev DK, Bozhevolnyi SI (2010) Plasmonics beyond the diffraction limit. Nat Photon 4:83–91
Herzig HP (1997) Micro-optics: elements, systems and applications. Taylor & Francis, London
Hopman WCL, Feridun A, Hu WB, Gadgil VJ, Kuipers L, Pollnau M, Ridder RMD (2007) Focused ion beam scan routine, dwell time and dose optimizations for submicrometre period planar photonic crystal components and stamps in silicon. Nanotechnology 18:195305 (11pp)
Kempshall BW, Schwarz SM, Prenitzer BI, Giannuzzi LA, Irwin RB, Stevie FA (2001) Ion channeling effects on the focused ion beam milling of Cu. J Vac Sci Technol B 19:749–754
Kometani R, Warisawa S, Ishihara S (2010) The 3D nanostructure growth evaluations by the real-time current monitoring on focused-ion-beam chemical vapor deposition. Microelectron Eng 87:1044–1048
Krasheninnikov AV, Nordlund K (2010) Ion and electron irradiation-induced effects in nanostructured materials. J Appl Phys 107:071301 (70 pages)
Lal S, Link S, Halas NJ (2007) Nano-optics from sensing to waveguiding. Nat Photon 1:641–648
Liu ZW, Durant S, Lee H, Pikus Y, Fang N, Xiong Y, Sun C, Zhang X (2007a) Far-field optical superlens. Nano Lett 7:403–408
Liu ZW, Lee H, Xiong Y, Sun C, Zhang X (2007b) Far-field optical hyperlens magnifying sub-diffraction-limited objects. Science 315:1686
Liu Y, Fu YQ, Zhou XL, Xu ZW, Fang FZ, Hu XD (2011) Experimental study of indirect phase tuning-based plasmonic structures for finely focusing. Plasmonics 6:227–233
Loeschner H, Fantner EJ, Korntner R et al (2002) Ion projection direct-structuring for nanotechnology applications. MRS 2002 fall meeting, Boston, Massachusetts
Matsui S (2003) Three-dimensional nanostructure fabrication by focused ion-beam chemical vapor deposition. In: Transducers, solid-state sensors, actuators and microsystems, 12th international conference, vol 1, Boston. pp 179–181
Menard LD, Ramsey JM (2011) Fabrication of sub-5 nm nanochannels in insulating substrates using focused ion beam milling. Nano Lett 11:512–517
Nagase T, Gamo K, Kubota T, Mashiko S (2005) Maskless fabrication of nanoelectrode structures with nanogaps by using Ga focused ion beams. Microelectron Eng 78–79:253–259
Pan A, Wang YL, Wu CS, Chen CD, Liu NW (2005) Effects of focused gallium ion-beam implantation on properties of nanochannels on silicon-on-insulator substrates. J Vac Sci Technol 23:2288–2291
Park BC, Jung KY, Song WY, Beom HO, Ahn SJ (2006) Bending of a carbon nanotube in vacuum using a focused ion beam. Adv Mater 18:95–98
Pelaz L, Marqués LA, Barbolla J (2004) Ion-beam-induced amorphization and recrystallization in silicon. J Appl Phys 96:5947–5976
Portavoce A, Hull R, Reuter MC, Ross FM (2007) Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation. Phys Rev B 76:235301
Reyntjens S, Puers R (2001) A review of focused ion beam applications in microsystem technology. J Micromech Microeng 11:287–300
Ridder RMD, Hopman WCL, Ay F (2007) Focused-ion-beam processing for photonics. In: 9th international conference on transparent optical networks, Rome, Italy. pp 212–215
Schrauwen J, Thourhout DV, Baets R (2006) Focused-ion-beam fabricated vertical fiber couplers in silicon-on-insulator waveguides. Appl Phys Lett 89:141102
Schrauwen J, Laere FV, Thourhout DV, Baets R (2007) Focused ion-beam fabrication of slanted grating coupler in silicon-on-insulator waveguides. IEEE Photon Technol Lett 19:816–818
Sebania L, Antonino LA (2010) Damage formation and evolution in ion-implanted crystalline Si. Mater Sci Ion Beams 116:147–212
Shi HF, Du CL, Luo XG (2007) Focal length modulation based on a metallic slit surrounded with grooves in curved depths. Appl Phys Lett 91:093111
Tanaka Y, Tymczenko M, Asano T, Noda S (2006) Fabrication of two-dimensional photonic crystal slab point-defect cavity employing local three-dimensional structures. Jpn J Appl Phys 45:6096–6102
Tian J, Yan W, Liu YZ, Luo J, Zhang DZ, Li ZY, Qiu M (2009) Optical quality improvement of Si photonic devices fabricated by focused-ion-beam milling. J Lightwave Technol 27(19):4306–4310
Tseng AA (2004) Recent developments in micromilling using focused ion beam technology. J Micromech Microeng 14:R15–R34
Urbánek M, Uhlíř V, Bábor P, Kolíbalová E, Hrnčíř T, Spousta J, Šikola T (2010) Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process. Nanotechnology 21:145304
Volkert CA, Minor AM (2007) Focused ion beam microscopy and micromachining. Mrs Bull 32:389–399
Whitlow HJ, Zhang Y (2010) Basics of ion scattering in nanoscale materials. Ion Beams Nanosci Technol 2:69–86
Xia L, Wu W, Xu J, Hao Y, Wang YY (2006) 3D Nanohelix fabrication and 3D nanometer assembly by focused ion beam stress-introducing technique. In: 19th IEEE international conference on micro electro mechanical systems (MEMS 2006), Istanbul, Turkey, pp 118–121
Xu ZW, Fang FZ, Fu YQ, Zhang SJ, Han T, Li JM (2009a) Fabrication of micro/nano structures using focused ion beam implantation and XeF2 gas assisted etching. J Micromech Microeng 19:054003 (9pp)
Xu ZW, Fang FZ, Hu XT (2009b) Fabrication of carbon nanotube probes in atomic force microscopy. Adv Mater Res 76–78:497–501
Xu ZW, Fang FZ, Zhang SJ, Zhang XD, Hu XT, Fu YQ, Li L (2010) Fabrication of micro DOE using micro tools shaped with focused ion beam. Opt Express 18:8025–8032
Yi AY, Li L (2005) Design and fabrication of a microlens array by use of a slow tool servo. Opt Lett 30:1707–1709
Zhang SJ, Fang FZ, Xu ZW, and Hu XT (2009) Controlled morphology of microtools shaped using focused ion beam milling technique, J. Vac. Sci. Technol. B 27(3):1304–1309
Zhang YW, Fu YQ, Zhou XL (2011) Investigation of metallic elliptical nano-pinholes structure-based plasmonic lenses: from design to testing. Insci J 1:18–29
Ziegler JF (2004) SRIM-2003. Nucl Instrum Methods Phys Res B 219–220:1027–1036
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Xu, Z.W., Fang, F., Zeng, G. (2015). Focused Ion Beam Nanofabrication Technology. In: Nee, A. (eds) Handbook of Manufacturing Engineering and Technology. Springer, London. https://doi.org/10.1007/978-1-4471-4670-4_66
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DOI: https://doi.org/10.1007/978-1-4471-4670-4_66
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