(WAXS) A technique for determining the amount of crystallinity and the sizes and perfection of crystals in polymers, in which diffraction patterns of X rays scattering at 20° to 50° from the incident beam are recorded on film and measured. X rays of wavelength from 0.1 to 0.3 nm are used to elucidate structural features with sizes from 0.1 to 2 nm. (Rhodes, G., Crystallography Made Crystal Clear: A Guide for Users of Macromolecular Models, Elsevier Science and Technology Books, New York, 1999)
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Gooch, J.W. (2011). Wide-Angle X-ray Scattering. In: Gooch, J.W. (eds) Encyclopedic Dictionary of Polymers. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-6247-8_12837
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DOI: https://doi.org/10.1007/978-1-4419-6247-8_12837
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