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Microscopic X-ray Fluorescence Analysis with Synchrotron Radiation Sources

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Book cover Handbook of Nuclear Chemistry

Abstract

This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications.

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Abbreviations

AES:

Auger emission spectrometry

CRM:

Certified reference material

DL:

Detection limit

ED:

Energy dispersive

ESRF:

European Synchrotron Radiation Facility

EXAFS:

Extended X-ray absorption fine structure

NEXAFS:

Near edge X-ray absorption fine structure

PCI:

Phase contrast imaging

RM:

Reference material

SR:

Synchrotron radiation

SRM:

Standard reference material

TXRF:

Total reflection X-ray fluorescence

XANES:

X-ray absorption near edge structure

XAS:

X-ray absorption spectrometry

XDM:

X-ray diffraction microscopy

XFCT:

X-ray fluorescence computerized microtomography

XPEEM:

X-ray photoelectron microscopy

XPS:

X-ray photoelectron spectrometry

XRD:

X-ray diffraction

XRF:

X-ray fluorescence

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Author information

Authors and Affiliations

  1. Campus Drie Eiken, University of Antwerp, Universiteitsplein 1, B-2610, Antwerp, Belgium

    F. Adams

  2. Department of Analytical Chemistry, Ghent University, Krijgslaan 281 – S12, Gent, Belgium

    B. Vekemans, G. Silversmit, B. De Samber & L. Vincze

Authors
  1. F. Adams
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  2. B. Vekemans
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  3. G. Silversmit
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  4. B. De Samber
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  5. L. Vincze
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Corresponding author

Correspondence to F. Adams .

Editor information

Editors and Affiliations

  1. Institute of Chemistry, Eötvös Loránd University, 32, Budapest, 1518, Hungary

    Attila Vértes (Professor Emeritus) & Sándor Nagy (Professor) (Professor Emeritus) &  (Professor)

  2. Chemical Research Center, Hungarian Academy of Sciences, Pusztaszeri út 59-67, Budapest, 1025, Hungary

    Zoltán Klencsár (Dr.) (Dr.)

  3. Institute of Nuclear Research (ATOMKI), Hungarian Academy of Sciences, 51, Debrecen, 4001, Hungary

    Rezső G. Lovas (Professor) (Professor)

  4. Institute of Nuclear Chemistry, Johannes Gutenberg University Mainz, Fritz-Strassmann-Weg 2, 55128, Mainz, Germany

    Frank Rösch (Professor) (Professor)

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Adams, F., Vekemans, B., Silversmit, G., De Samber, B., Vincze, L. (2011). Microscopic X-ray Fluorescence Analysis with Synchrotron Radiation Sources. In: Vértes, A., Nagy, S., Klencsár, Z., Lovas, R.G., Rösch, F. (eds) Handbook of Nuclear Chemistry. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-0720-2_34

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