Scanning Probe Microscopy (Includes Atomic Force Microscopy)
Atomic force microscopy; Atomic probe microscopy; Force microscopy; Scanning force microscopy
Scanning probe microscopy uses a nanoscopic probe that is scanned over a solid surface. The interaction between the probe and the surface may be a mechanical or electromagnetic force. The force signal is enhanced and then composed to a force diagram of the surface. Under ideal conditions, an atomic-scale resolution may be achieved.
KeywordsAtomic Force Microscopy Scanning Tunneling Microscope Magnetic Force Microscopy Scan Force Microscopy Cantilever Deflection
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