Encyclopedia of Geobiology

2011 Edition
| Editors: Joachim Reitner, Volker Thiel

Scanning Probe Microscopy (Includes Atomic Force Microscopy)

  • Michael Hoppert
Reference work entry
DOI: https://doi.org/10.1007/978-1-4020-9212-1_15


Atomic force microscopy; Atomic probe microscopy; Force microscopy; Scanning force microscopy


Scanning probe microscopy uses a nanoscopic probe that is scanned over a solid surface. The interaction between the probe and the surface may be a mechanical or electromagnetic force. The force signal is enhanced and then composed to a force diagram of the surface. Under ideal conditions, an atomic-scale resolution may be achieved.


Since their development during the 1970s and early 1980s, scanning probe microscopes (SPMs) have developed into instruments suitable for the analysis of surface topography (and other surface properties) down to near-atomic resolutions. All instruments belonging to this family contain essential components as depicted in Figure 1. In the scanning process, surface material properties are mapped in all three directions. The essential parts of the system are the sharp scanning probe tip, which moves in the zdirection, a piezoelectric...


Atomic Force Microscopy Scanning Tunneling Microscope Magnetic Force Microscopy Scan Force Microscopy Cantilever Deflection 
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© Springer Science+Business Media B.V. 2011

Authors and Affiliations

  • Michael Hoppert
    • 1
  1. 1.Institut für Mikrobiologie und GenetikUniversity of GöttingenGöttingenGermany