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Scanning Probe Microscopy (Includes Atomic Force Microscopy)

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Encyclopedia of Geobiology

Part of the book series: Encyclopedia of Earth Sciences Series ((EESS))

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Synonyms

Atomic force microscopy; Atomic probe microscopy; Force microscopy; Scanning force microscopy

Definition

Scanning probe microscopy uses a nanoscopic probe that is scanned over a solid surface. The interaction between the probe and the surface may be a mechanical or electromagnetic force. The force signal is enhanced and then composed to a force diagram of the surface. Under ideal conditions, an atomic-scale resolution may be achieved.

Introduction

Since their development during the 1970s and early 1980s, scanning probe microscopes (SPMs) have developed into instruments suitable for the analysis of surface topography (and other surface properties) down to near-atomic resolutions. All instruments belonging to this family contain essential components as depicted in Figure 1. In the scanning process, surface material properties are mapped in all three directions. The essential parts of the system are the sharp scanning probe tip, which moves in the zdirection, a piezoelectric...

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Author information

Authors and Affiliations

  1. Institut für Mikrobiologie und Genetik, University of Göttingen, Grisebachstraße 8, 37077, Göttingen, Germany

    Michael Hoppert

Authors
  1. Michael Hoppert
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Editor information

Editors and Affiliations

  1. University of Göttingen, Göttingen, Germany

    Joachim Reitner  & Volker Thiel  & 

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Hoppert, M. (2011). Scanning Probe Microscopy (Includes Atomic Force Microscopy). In: Reitner, J., Thiel, V. (eds) Encyclopedia of Geobiology. Encyclopedia of Earth Sciences Series. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-9212-1_15

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