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Synchrotron Small-Angle X-Ray Scattering

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Soft Matter Characterization

1 Introduction

Small-angle X-ray scattering (SAXS) is a well established technique to probe the nano-scale structure and fluctuations in soft matter. The scattering of X-rays at small-angles originate from the spatial fluctuations of the electron density within the material. The amount of structural information obtained from the scattering experiment depends to some extent on the degree of supermolecular order within the sample. For example, this can be the shape and a few parameters like the radius of gyration in the case of a dilute macromolecular suspension, while a molecular resolution structural model may be derived with a highly ordered fibre. Like other complementary scattering methods using visible light or neutrons, SAXS is a non-invasive structural technique. The high photon flux and collimation provided by modern synchrotron sources has made SAXS a unique scattering technique in terms of angular and time resolution, small sample volume, etc. Time-resolved experiments down to...

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Acknowledgements

I thank A.R. Rennie for a careful reading of the manuscript and M. Ballauff for comments. The experimental results presented in this Chapter involved contributions from many collaborators and colleagues especially P. Boesecke, N. Dingenouts, A. Mahendrasingam, P. Panine, D. Pontoni, and T. Weiss. I thank the Editors R. Borsali and R. Pecora for this invitation. ESRF is acknowledged for the financial support and the provision of synchrotron beam time.

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Authors and Affiliations

  1. European Synchrotron Radiation Facility Grenoble Cedex, Grenoble Cedex, France

    T. Narayanan

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  1. T. Narayanan
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Editors and Affiliations

  1. CERMAV, CNRS-UPR 5301 and Joseph Fourier University, Grenoble Cedex 9, France

    Redouane Borsali

  2. Department of Chemistry, University of California - Stanford Stauffer II, 375 North-South Mall, 94305-5080, Stanford, CA, USA

    Robert Pecora (Professor) (Professor)

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Narayanan, T. (2008). Synchrotron Small-Angle X-Ray Scattering. In: Borsali, R., Pecora, R. (eds) Soft Matter Characterization. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-4465-6_17

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