Abstract
Light interacts with materials in a variety of ways; this chapter focuses on refraction and absorption. Refraction is characterized by a materialʼs refractive index. We discuss some of the most useful models for the frequency dependence of the refractive index, such as those due to Cauchy, Sellmeier, Gladstone–Dale, and Wemple–Di Dominico. Examples are given of the applicability of the models to actual materials. We present various mechanisms of light absorption, including absorption by free carriers, phonons, excitons and impurities. Special attention is paid to fundamental and excitonic absorption in disordered semiconductors and to absorption by rare-earth, trivalent ions due to their importance to modern photonics. We also discuss the effect of an external electric field on absorption, and the Faraday effect. Practical techniques for determining the optical parameters of thin films are outlined. Finally, we present a short technical classification of optical glasses and materials.
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Abbreviations
- CB:
-
conduction band
- DOS:
-
density of states
- ED:
-
electrodeposition
- EM:
-
electromagnetic
- FCA:
-
free-carrier absorption
- JO:
-
Judd–Ofelt
- LF:
-
low-frequency
- LO:
-
longitudinal optical
- MQW:
-
multiple quantum well
- PC:
-
photoconductive
- PMMA:
-
poly(methyl-methacrylate)
- QW:
-
quantum well
- RE:
-
rare earth
- TCRI:
-
temperature coefficient of refractive index
- TO:
-
transverse optical
- UV:
-
ultraviolet
- VB:
-
valence band
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Kasap, S., Koughia, C., Singh, J., Ruda, H., OʼLeary, S. (2006). Optical Properties of Electronic Materials: Fundamentals and Characterization. In: Kasap, S., Capper, P. (eds) Springer Handbook of Electronic and Photonic Materials. Springer Handbooks. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-29185-7_3
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