Abstract
Two of the more significant technological achievements during the last 20 years have been the development of MEMS and its new offshoot, NEMS. These developments were made possible in large measure by significant advancements in the materials and processes used in the fabrication of MEMS and NEMS devices. And while initial developments capitalized on a mature Si infrastructure, recent advances have used materials and processes not associated with IC fabrication, a trend that is likely to continue as new application areas are identified.
A well-rounded understanding of MEMS and NEMS requires a basic knowledge of the materials used to construct the devices, since material properties often govern device performance. An understanding of the materials used in MEMS and NEMS is really an understanding of material systems. Devices are rarely constructed of a single material, but rather a collection of materials, each providing a critical function and often working in conjunction with each other. It is from this perspective that the following chapter is constructed. A preview of the materials selected for inclusion is presented in Table 7.1. From this table it is easy to see that this chapter is not a summary of all materials used in MEMS and NEMS, as such a work would itself constitute a text of significant size. It does, however, present a selection of some of the more important material systems, including examples that illustrate the importance of viewing MEMS and NEMS in terms of material systems.
Abbreviations
- AFM:
-
atomic force microscope/microscopy
- APCVD:
-
atmospheric pressure chemical vapor deposition
- CVD:
-
chemical vapor deposition
- DRIE:
-
deep reactive ion etching
- FET:
-
field-effect transistor
- IC:
-
integrated circuit
- ITO:
-
indium tin oxide
- LPCVD:
-
low pressure chemical vapor deposition
- MEMS:
-
microelectromechanical systems
- MOCVD:
-
metalorganic CVD
- NEMS:
-
nanoelectromechanical systems
- PECVD:
-
plasma enhanced CVD
- PMMA:
-
poly(methylmethacrylate)
- PSG:
-
phosphorus-doped glass
- PZT:
-
lead zirconate titanate
- RF:
-
radiofrequency
- RIE:
-
reactive ion etching
- SEM:
-
scanning electron microscope/microscopy
- TMAH:
-
tetramethyl-aluminium hydroxide
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Zorman, C.A., Mehregany, M. (2004). Materials Aspects of Micro- and Nanoelectromechanical Systems. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29838-X_7
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