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Springer Handbook of Nanotechnology pp 543–603Cite as

Surface Forces and Nanorheology of Molecularly Thin Films

  • Reference work entry

Part of the book series: Springer Handbooks ((SHB))

Abstract

In this chapter, we describe the static and dynamic normal forces that occur between surfaces in vacuum or liquids and the different modes of friction that can be observed between (i) bare surfaces in contact (dry or interfacial friction), (ii) surfaces separated by a thin liquid film (lubricated friction), and (iii) surfaces coated with organic monolayers (boundary friction).

Experimental methods suitable for measuring normal surface forces, adhesion and friction (lateral or shear) forces of different magnitude at the molecular level are described. We explain the molecular origin of van der Waals, electrostatic, solvation and polymer mediated interactions, and basic models for the contact mechanics of adhesive and nonadhesive elastically deforming bodies. The effects of interaction forces, molecular shape, surface structure and roughness on adhesion and friction are discussed.

Simple models for the contributions of the adhesion force and external load to interfacial friction are illustrated with experimental data on both unlubricated and lubricated systems, as measured with the surface forces apparatus. We discuss rate-dependent adhesion (adhesion hysteresis) and how this is related to friction. Some examples of the transition from wearless friction to friction with wear are shown.

Lubrication in different lubricant thickness regimes is described together with explanations of nanorheological concepts. The occurrence of and transitions between smooth and stick–slip sliding in various types of dry (unlubricated and solid boundary lubricated) and liquid lubricated systems are discussed based on recent experimental results and models for stick–slip involving memory distance and dilatency.

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Abbreviations

AFM:

atomic force microscope/microscopy

DLVO:

Derjaguin–Landau–Verwey–Overbeek

DMT:

Derjaguin–Muller–Toporov

EHD:

electrohydrodynamic

JKR:

Johnson–Kendall–Roberts

LFM:

lateral force microscope

PDMS:

polydimethylsiloxane

PS:

polystyrene

PTFE:

polytetrafluoroethylene

RICM:

reflection interface contrast microscopy

SFA:

surface forces apparatus

TIRM:

total internal reflection microscopy

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Acknowledgements

This work was supported by ONR grant N00014-00-1–0214. M. R. thanks the Academy of Finland for financial support.

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Authors and Affiliations

  1. Department of Physical Chemistry, Åbo Akademi University, Porthansgatan 3–5, 20500, Åbo, Finland

    Marina Ruths Dr.

  2. Monitor Venture Enterprises, 241 S. Figueroa St. Suite 300, 90012, Los Angeles, CA, USA

    Alan D. Berman Dr.

  3. Department of Chemical Engineering and Materials Department, University of California, 93106, Santa Barbara, CA, USA

    Jacob N. Israelachvili Prof.

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  1. Marina Ruths Dr.
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  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS, The Ohio State University, 206 W. 18th Avenue, 43210-1107, Columbus, OH, USA

    Bharat Bhushan Prof.

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Ruths, M., Berman, A.D., Israelachvili, J.N. (2004). Surface Forces and Nanorheology of Molecularly Thin Films. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29838-X_18

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